High resolution electron tomography

Current Opinion in Solid State and Materials Science

Volumn 17, Issue 3, 2013, Pages 107-114

  Bals, Sara ^a   Van Aert, Sandra ^a   Van Tendeloo, Gustaaf ^a  

^a UNIVERSITY OF ANTWERP   (Belgium)

Author keywords

3 Dimensional reconstruction; Advanced electron microscopy; Atomic resolution; Electron tomography; Nanostructures

Indexed keywords

ATOMS; ELECTRIC IMPEDANCE TOMOGRAPHY; NANOSTRUCTURES;

3-DIMENSIONAL; ATOMIC LEVELS; ATOMIC RESOLUTION; ELECTRON TOMOGRAPHY; FUTURE CHALLENGES; HIGH-RESOLUTION ELECTRON TOMOGRAPHY;

ELECTRONS;

EID: 84882246596     PISSN: 13590286     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.cossms.2013.03.001     Document Type: Review

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