3D analysis of semiconductor structures using STEM tomography

Microscopy of Semiconducting Materials 2003

Volumn , Issue , 2018, Pages 541-544

  Yates, T J V ^a   Weyland, M ^a   Laffont, L ^a   Zhi, D ^a   Dunin Borkowski, R E ^a   Midgley, P A ^a  

^a UNIVERSITY OF CAMBRIDGE   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC IMPEDANCE TOMOGRAPHY; HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY; NANOCRYSTALS; PROBES; SCANNING ELECTRON MICROSCOPY; SEMICONDUCTOR QUANTUM DOTS; TRANSMISSION ELECTRON MICROSCOPY;

3-D-ANALYSIS; 3D PROBE; 3D RESOLUTION; ELECTRON TOMOGRAPHY; QUANTUM DOT STRUCTURE; SCANNING TRANSMISSION ELECTRON MICROSCOPY; SEMICONDUCTOR STRUCTURE; THREE-DIMENSIONAL STRUCTURE;

IMAGE RECONSTRUCTION;

EID: 85053297641     PISSN: None     EISSN: None     Source Type: Book    
DOI: 10.1201/9781351074636     Document Type: Chapter

References (8)

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8. Zhi D, Wei M, Jones T S, Pashley D W, Zhang J, Joyce B A, Dunin-Burkowski R E and Midgley P A 2003 this Proceedings volume