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Volumn 114, Issue 1, 2013, Pages

Migration of interfacial oxygen ions modulated resistive switching in oxide-based memory devices

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRODE SELECTION; INTERFACIAL LAYER; INTERFACIAL OXYGEN; NON-VOLATILE MEMORY; RESISTIVE SWITCHING; RESISTIVE SWITCHING BEHAVIORS; RESISTIVE SWITCHING MEMORY; SWITCHING CHARACTERISTICS;

EID: 84880897834     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.4812486     Document Type: Article
Times cited : (81)

References (40)
  • 1
    • 36849125984 scopus 로고
    • 10.1063/1.1702530
    • T. W. Hickmott, J. Appl. Phys. 33, 2669 (1962). 10.1063/1.1702530
    • (1962) J. Appl. Phys. , vol.33 , pp. 2669
    • Hickmott, T.W.1
  • 30
    • 84863116936 scopus 로고    scopus 로고
    • 10.1557/mrs.2012.4
    • T. Lee and Y. Chen, MRS Bull. 37, 144 (2012). 10.1557/mrs.2012.4
    • (2012) MRS Bull. , vol.37 , pp. 144
    • Lee, T.1    Chen, Y.2
  • 33
    • 32444433522 scopus 로고    scopus 로고
    • 15th ed. (McGraw-Hill Professional, Columbus).
    • J. A. Dean, Lange's Handbook of Chemistry, 15th ed. (McGraw-Hill Professional, Columbus, 1998).
    • (1998) Lange's Handbook of Chemistry
    • Dean, J.A.1
  • 39
    • 0028442221 scopus 로고
    • 10.1016/0965-9773(94)90135-X
    • C. R. Aita, Nanostruct. Mater. 4, 257 (1994). 10.1016/0965-9773(94)90135- X
    • (1994) Nanostruct. Mater. , vol.4 , pp. 257
    • Aita, C.R.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.