Direct observation at nanoscale of resistance switching in NiO layers by conductive-atomic force microscopy

Applied Physics Express

Volumn 4, Issue 5, 2011, Pages

  Deleruyelle, Damien ^a   Dumas, Carine ^a   Carmona, Marion ^a   Muller, Christophe ^a   Spiga, Sabina ^b   Fanciulli, Marco ^b,c  

^a AIX MARSEILLE UNIVERSITÉ   (France)

^b LABORATORIO MDM   (Italy)

^c UNIVERSITY OF MILANO BICOCCA   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; NICKEL OXIDE;

BOTTOM ELECTRODES; CONDUCTIVE ATOMIC FORCE MICROSCOPY; DIRECT OBSERVATIONS; FILAMENTARY CONDUCTION; HIGH RESISTIVE STATE; RESISTANCE SWITCHING; RESISTIVE SWITCHING; RETENTION MEASUREMENT;

NANOTECHNOLOGY;

EID: 79956151452     PISSN: 18820778     EISSN: 18820786     Source Type: Journal    
DOI: 10.1143/APEX.4.051101     Document Type: Article

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