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Volumn 199, Issue , 2013, Pages 18-23

Current transport mechanism of antimony-doped TiO2 nanoparticles based on MOS device

Author keywords

Fowler Nordheim tunneling; I V and C V characteristics; Metal oxide semiconductor (MOS) device; Sb doped TiO2 nanoparticles

Indexed keywords

CAPACITANCE VOLTAGE MEASUREMENTS; CURRENT TRANSPORT MECHANISM; ELECTRICAL CHARACTERIZATION; FIELD EMISSION SCANNING ELECTRON MICROSCOPES; FOWLER-NORDHEIM TUNNELING; I-V AND C-V CHARACTERISTICS; METAL OXIDE SEMICONDUCTOR; TIO;

EID: 84878858490     PISSN: 09244247     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.sna.2013.04.037     Document Type: Article
Times cited : (21)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.