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Volumn 37, Issue 12, 2012, Pages 1195-1202

STM studies of epitaxial graphene

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRONIC CHARACTERIZATION; EPITAXIAL GRAPHENE; GRAPHENE LAYERS; ROTATIONAL DISORDER; SCANNING TUNNELING SPECTROSCOPY; STM STUDY; STM/STS; TOPOGRAPHICAL VARIATIONS;

EID: 84870044392     PISSN: 08837694     EISSN: None     Source Type: Journal    
DOI: 10.1557/mrs.2012.204     Document Type: Review
Times cited : (16)

References (96)
  • 1
    • 67649225738 scopus 로고    scopus 로고
    • and references therein
    • A.K. Geim, Science 324, 1530 (2009), and references therein
    • (2009) Science , vol.324 , pp. 1530
    • Geim, A.K.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.