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Volumn , Issue , 2012, Pages 541-547

High aspect ratio TSVs fabricated by magnetic self-assembly of gold-coated nickel wires

Author keywords

[No Author keywords available]

Indexed keywords

CONVENTIONAL APPROACH; ELECTRICAL CHARACTERISTIC; EMERGING TECHNOLOGIES; FABRICATION TECHNIQUE; GOLD-COATED; HIGH-ASPECT RATIO; MANUFACTURING TECHNOLOGIES; METAL DEPOSITION; NICKEL RODS; NICKEL WIRES; PARASITIC CAPACITANCE; PRODUCTION COST; RF APPLICATIONS; SIGNAL LENGTH; STACKED DIE; THREE DIMENSIONAL (3D) INTEGRATION; THROUGH SILICON VIAS; THROUGH-SILICON-VIA HOLE; THROUGH-WAFER VIAS;

EID: 84866328428     PISSN: 05695503     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ECTC.2012.6248882     Document Type: Conference Paper
Times cited : (6)

References (29)
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  • 2
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  • 3
    • 68549115318 scopus 로고    scopus 로고
    • Two-dimensional and three-dimensional integration of heterogeneous electronic systems under cost, performance, and technological constraints
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    • R. Weerasekera, D. Pamunuwa, L.-R. Zheng, and H. Tenhunen, "Two-dimensional and three-dimensional integration of heterogeneous electronic systems under cost, performance, and technological constraints," Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on, vol. 28, no. 8, pp. 1237-1250, aug. 2009.
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    • Fabrication and characterization of through-substrate interconnects
    • june
    • J. Wu and J. del Alamo, "Fabrication and characterization of through-substrate interconnects," Electron Devices, IEEE Transactions on, vol. 57, no. 6, pp. 1261-1268, june 2010.
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.