Ultra-high vacuum scanning thermal microscopy for nanometer resolution quantitative thermometry

ACS Nano

Volumn 6, Issue 5, 2012, Pages 4248-4257

  Kim, Kyeongtae ^a   Jeong, Wonho ^a   Lee, Woochul ^a   Reddy, Pramod ^a  

^a UNIVERSITY OF MICHIGAN   (United States)

Author keywords

Nanoscale thermal contact; Quantitative temperature profiling; Scanning thermal microscopy; Thermocouple probe; Ultrahigh vacuum

Indexed keywords

ATOMIC FORCE MICROSCOPE CANTILEVERS; COMPUTATIONAL RESULTS; DIELECTRIC SURFACE; ELECTRON TRANSPORT; HEAT TRANSPORT; NANO SCALE; NANOMETER RESOLUTIONS; NANOSCALE RESOLUTIONS; QUANTITATIVE MEASUREMENT; SCANNING THERMAL MICROSCOPE; SCANNING THERMAL MICROSCOPY; SPATIAL RESOLUTION; TEMPERATURE PROFILING; TEMPERATURE RESOLUTION; THERMAL CONTACT; THERMAL FIELD; THERMOCOUPLE PROBES;

ATOMIC FORCE MICROSCOPY; CHROMIUM; ENERGY DISSIPATION; PLATINUM; PROBES; SCANNING; THERMOCOUPLES; ULTRAHIGH VACUUM;

NANOTECHNOLOGY;

EID: 84864678214     PISSN: 19360851     EISSN: 1936086X     Source Type: Journal    
DOI: 10.1021/nn300774n     Document Type: Article

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