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Volumn 519, Issue 1, 2010, Pages 312-318
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Nanomechanical characterization of thermally evaporated Cr thin films - FE analysis of the substrate effect
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Author keywords
Deformation; Finite element analysis; Hardness; Nanoindentation; Thin films
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Indexed keywords
CHROMIUM THIN FILMS;
CIRCUMFERENTIAL CRACKS;
CR FILM;
DEFORMATION BEHAVIOUR;
DIFFERENT SUBSTRATES;
FE ANALYSIS;
FINITE ELEMENT ANALYSIS;
HARD FILMS;
HARD SUBSTRATE;
HARDNESS VARIATION;
NANOINDENTATION TECHNIQUES;
NANOMECHANICAL CHARACTERIZATION;
PLASTIC ZONES;
RADIAL CRACKS;
SI(1 0 0);
SOFT FILM;
SOFT SUBSTRATES;
STRESS DISTRIBUTION;
SUBSTRATE EFFECTS;
CHROMIUM;
CRACKS;
DEFORMATION;
FINITE ELEMENT METHOD;
HARDNESS;
NANOINDENTATION;
STRESS CONCENTRATION;
THIN FILMS;
VAPOR DEPOSITION;
SUBSTRATES;
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EID: 77957718320
PISSN: 00406090
EISSN: None
Source Type: Journal
DOI: 10.1016/j.tsf.2010.07.055 Document Type: Article |
Times cited : (14)
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References (26)
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