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Volumn 519, Issue 1, 2010, Pages 312-318

Nanomechanical characterization of thermally evaporated Cr thin films - FE analysis of the substrate effect

Author keywords

Deformation; Finite element analysis; Hardness; Nanoindentation; Thin films

Indexed keywords

CHROMIUM THIN FILMS; CIRCUMFERENTIAL CRACKS; CR FILM; DEFORMATION BEHAVIOUR; DIFFERENT SUBSTRATES; FE ANALYSIS; FINITE ELEMENT ANALYSIS; HARD FILMS; HARD SUBSTRATE; HARDNESS VARIATION; NANOINDENTATION TECHNIQUES; NANOMECHANICAL CHARACTERIZATION; PLASTIC ZONES; RADIAL CRACKS; SI(1 0 0); SOFT FILM; SOFT SUBSTRATES; STRESS DISTRIBUTION; SUBSTRATE EFFECTS;

EID: 77957718320     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.tsf.2010.07.055     Document Type: Article
Times cited : (14)

References (26)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.