Quantitative thermometry of nanoscale hot spots

Nano Letters

Volumn 12, Issue 2, 2012, Pages 596-601

  Menges, Fabian ^a,b   Riel, Heike ^a   Stemmer, Andreas ^b   Gotsmann, Bernd ^a  

^a IBM RESEARCH ZURICH   (Switzerland)

^b ETH ZURICH   (Switzerland)

Author keywords

nanoscale hot spots; nanowire; quantitative thermometry; Scanning thermal microscopy; self heating

Indexed keywords

HEAT SOURCES; HOT SPOT; LOCAL TEMPERATURE; NANO SCALE; NANOSCALE RESOLUTIONS; QUANTITATIVE THERMOMETRY; SCANNING THERMAL MICROSCOPY; SELF-HEATING; SILICON NANOWIRES; TEMPERATURE PROFILES; THERMAL CONDUCTANCE;

HEAT FLUX; NANOTECHNOLOGY; THERMOMETERS;

NANOWIRES;

NANOWIRE; SILICON;

ARTICLE; CHEMISTRY; SCANNING ELECTRON MICROSCOPY; SURFACE PROPERTY; TEMPERATURE; THERMAL CONDUCTIVITY;

MICROSCOPY, ELECTRON, SCANNING; NANOWIRES; SILICON; SURFACE PROPERTIES; TEMPERATURE; THERMAL CONDUCTIVITY;

EID: 84856951901     PISSN: 15306984     EISSN: 15306992     Source Type: Journal    
DOI: 10.1021/nl203169t     Document Type: Article

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