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Volumn 22, Issue 2, 2001, Pages 617-629
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Thermal conductivity measurement of submicron-thick films deposited on substrates by modified ac calorimetry (laser-heating ångstrom method)
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Author keywords
ngstrom method; Ac calorimetry; Aluminum nitride; Aluminum oxide; CD R; Thermal conductivity; Thermal diffusivity; Thin film
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Indexed keywords
ALUMINUM NITRIDE;
CALORIMETRY;
DEPOSITION;
LASER BEAM EFFECTS;
OXIDES;
SUBSTRATES;
TECHNOLOGY;
THERMAL CONDUCTIVITY OF SOLIDS;
THERMAL DIFFUSION IN SOLIDS;
AC CALORIMETRY;
COMPOSITE THIN FILMS;
ENERGY SOURCES;
FILM THICKNESS;
THICK FILMS;
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EID: 0011965246
PISSN: 0195928X
EISSN: None
Source Type: Journal
DOI: 10.1023/A:1010745603645 Document Type: Article |
Times cited : (73)
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References (20)
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