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Volumn 22, Issue 2, 2001, Pages 617-629

Thermal conductivity measurement of submicron-thick films deposited on substrates by modified ac calorimetry (laser-heating ångstrom method)

Author keywords

ngstrom method; Ac calorimetry; Aluminum nitride; Aluminum oxide; CD R; Thermal conductivity; Thermal diffusivity; Thin film

Indexed keywords

ALUMINUM NITRIDE; CALORIMETRY; DEPOSITION; LASER BEAM EFFECTS; OXIDES; SUBSTRATES; TECHNOLOGY; THERMAL CONDUCTIVITY OF SOLIDS; THERMAL DIFFUSION IN SOLIDS;

EID: 0011965246     PISSN: 0195928X     EISSN: None     Source Type: Journal    
DOI: 10.1023/A:1010745603645     Document Type: Article
Times cited : (73)

References (20)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.