Molecular depth profiling of model biological films using low energy monoatomic ions

International Journal of Mass Spectrometry

Volumn 321-322, Issue , 2012, Pages 1-7

  Brison, J ^a   Mine, N ^a   Wehbe, N ^a   Gillon, X ^a   Tabarrant, T ^a   Sporken, R ^a   Houssiau, L ^a  

^a UNIVERSITY OF NAMUR   (Belgium)

Author keywords

Amino acids; Cs; Depth profiling; Low energy cesium; Model biological films; Molecular; ToF SIMS; XPS

Indexed keywords

EID: 84864467103     PISSN: 13873806     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ijms.2012.04.001     Document Type: Article

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