Molecular depth profiling of sucrose films: A comparative study of C 60n+ ions and traditional Cs+ and O 2+ ions

Analytical Chemistry

Volumn 81, Issue 20, 2009, Pages 8272-8279

  Zhu, Zihua ^a   Nachimuthu, Ponnusamy ^a   Lea, Alan S ^a  

^a PACIFIC NORTHWEST NATIONAL LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

AFM IMAGE; CHEMICAL CHANGE; COMPARATIVE STUDIES; INDUCED DAMAGE; LOW ENERGIES; MOLECULAR DEPTH PROFILING; MOLECULAR IONS; NOISE LEVELS; OPTIMAL CHOICE; SPUTTERING MODELS; STEADY STATE; TIME OF FLIGHT SECONDARY ION MASS SPECTROMETRY; XPS DATA;

AMORPHOUS CARBON; ATOMIC FORCE MICROSCOPY; ATOMIC SPECTROSCOPY; CESIUM; DEPTH PROFILING; ION SOURCES; IONS; SECONDARY ION MASS SPECTROMETRY; SUGAR (SUCROSE); X RAY PHOTOELECTRON SPECTROSCOPY;

CESIUM COMPOUNDS;

CARBON; CESIUM; OXYGEN; SUCROSE;

ARTICLE; ATOMIC FORCE MICROSCOPY; BIOFILM; NOISE; X RAY PHOTOELECTRON SPECTROSCOPY;

CESIUM; FULLERENES; MICROSCOPY, ATOMIC FORCE; OXYGEN; PHOTOELECTRON SPECTROSCOPY; SILICON; SUCROSE; SURFACE PROPERTIES;

EID: 70449824294     PISSN: 00032700     EISSN: None     Source Type: Journal    
DOI: 10.1021/ac900553z     Document Type: Article

References (35)

1. Pacholski, M. L.; Winograd, N. Chem. Rev. 1999, 99, 2977-3005.
2. Benninghoven, A.; Rudenauer, F.; Werner, W. Secondary Ion Mass Spectrometry; John Wiley & Sons Ltd.: Chichester, U.K., 1987.
3. Vickerman, J. C., Briggs, D., Eds. ToF-SIMS: Surface Analysis by Mass Spectrometry; IM Publications and SurfaceSpectra Limited: Manchester, U.K., 2001.
4. Weibel, D.; Wong, S.; Lockyer, N.; Blenkinsopp, P.; Hill, R.; Vickerman, J. C. Anal. Chem. 2003, 75, 1754-1764.
5. Winograd, N. Anal. Chem. 2005, 77, 142A-149A.
6. Wong, S. C. C.; Hill, R.; Blenkinsopp, P.; Lockyer, N. P.; Weibel, D. E.; Vickerman, J. C. Appl. Surf. Sci. 2003, 203, 219-222.
7. Breitenstein, D.; Rommel, C. E.; Mollers, R.; Wegener, J.; Hagenhoff, B. Angew. Chem., Int. Ed. 2007, 46, 5332-5335.
8. Debois, D.; Brunelle, A.; Laprevote, O. Int. J. Mass Spectrom. 2007, 260, 115-120.
9. Fletcher, J. S.; Lockyer, N. P.; Vaidyanathan, S.; Vickerman, J. C. Anal. Chem. 2007, 79, 2199-2206.
10. Jones, E. A.; Lockyer, N. P.; Vickerman, J. C. Int. J. Mass Spectrom. 2007, 260, 146-157.
11. Jones, E. A.; Lockyer, N. P.; Vickerman, J. C. Anal. Chem. 2008, 80, 2125-2132.
12. Nygren, H.; Hagenhoff, B.; Malmberg, P.; Nilsson, M.; Richter, K. Microsc. Res. Tech. 2007, 70, 969-974.
13. Piehowski, P. D.; Kurczy, M. E.; Willingham, D.; Parry, S.; Heien, M. L.; Winograd, N.; Ewing, A. G. Langmuir 2008, 24, 7906-7911.
14. Vaidyanathan, S.; Fietcher, J. S.; Goodacre, R.; Lockyer, N. P.; Micklefield, J.; Vickerman, J. C. Anal. Chem. 2008, 80, 1942-1951.
15. Hinder, S. J.; Lowe, C.; Watts, J. F. Surf. Interface Anal. 2007, 39, 467-475.
16. Hinder, S. J.; Watts, J. F.; Simmons, G. C.; Lowe, C. Surf. Interface Anal. 2008, 40, 436-440.
17. Szakal, C.; Sun, S.; Wucher, A.; Winograd, N. Appl. Surf. Sci. 2004, 231-2, 183-185.
18. Shard, A. G.; Green, F. M.; Brewer, P. J.; Seah, M. P.; Gilmore, I. S. J. Phys. Chem. B 2008, 112, 2596-2605.
19. Weibel, D. E.; Lockyer, N.; Vickerman, J. C. Appl. Surf. Sci. 2004, 231-2, 146-152.
20. Cheng, J.; Winograd, N. Anal. Chem. 2005, 77, 3651-3659.
21. Parry, S.; Winograd, N. Anal. Chem. 2005, 77, 7950-7957.
22. Mine, N.; Douhard, B.; Brison, J.; Houssiau, L. Rapid Commun. Mass Spectrom. 2007, 21, 2680-2684.
23. Cheng, J.; Wucher, A.; Winograd, N. J. Phys. Chem. B 2006, 110, 8329-8336.
24. Wucher, A.; Cheng, J.; Winograd, N. Appl. Surf. Sci. 2008, 255, 959-961.
25. Postawa, Z.; Czerwinski, B.; Szewczyk, M.; Smiley, E. J.; Winograd, N.; Garrison, B. J. J. Phys. Chem. B 2004, 108, 7831-7838.
26. Russo, M. F.; Szakal, C.; Kozole, J.; Winograd, N.; Garrison, B. J. Anal. Chem. 2007, 79, 4493-4498.
27. Cheng, J.; Kozole, J.; Hengstebeck, R.; Winograd, N. J. Am. Soc. Mass Spectrom. 2007, 18, 406-412.
28. Hill, R.; Blenkinsopp, R.; Barber, A.; Everest, C. Appl. Surf. Sci. 2006, 252, 7304-7307.
29. Sanada, N.; Yamamoto, A.; Oiwa, R.; Ohashi, Y. Surf. Interface Anal. 2004, 36, 280-282.
30. Yamamoto, Y.; Higashi, S.; Yamamoto, K. Surf. Interface Anal. 2008, 40, 1631-1634.
31. Chen, Y. Y.; Yu, B. Y.; Wang, W. B.; Hsu, M. F.; Lin, W. C.; Lin, Y. C.; Jou, J. H.; Shyue, J. J. Anal. Chem. 2008, 80, 501-505.
32. Vu, B. Y.; Chen, Y. Y.; Wang, W. B.; Hsu, M. F.; Tsai, S. P.; Lin, W. C.; Lin, Y. C.; Jou, J. H.; Chu, C. W.; Shyue, J. J. Anal. Chem. 2008, 80, 3412-3415.
33. Gillen, G.; Batteas, J.; Michaels, C. A.; Chi, P.; Small, J.; Windsor, E.; Fahey, A.; Verkouteren, J.; Kim, K. J. Appl. Surf. Sci. 2006, 252, 6521-6525.
34. Postawa, Z.; Czerwinski, B.; Szewczyk, M.; Smiley, E. J.; Winograd, N.; Garrison, B. J. Anal. Chem. 2003, 75, 4402-4407.
35. Postawa, Z.; Czerwinski, B.; Winograd, N.; Garrison, B. J. J. Phys. Chem. B 2005, 109, 11973-11979.