|
Volumn 77, Issue 7, 2005, Pages
|
The magic of cluster SIMS
|
Author keywords
[No Author keywords available]
|
Indexed keywords
DESORPTION;
ION BEAMS;
ION SOURCES;
MOLECULAR DYNAMICS;
PARTICLE SIZE ANALYSIS;
SURFACE PROPERTIES;
CLUSTER ION SOURCES;
ION BEAM SOURCES;
SURFACE ANALYSIS;
SECONDARY ION MASS SPECTROMETRY;
CARBON;
GOLD COMPLEX;
ANALYTIC METHOD;
CLUSTER ANALYSIS;
COMPUTER SIMULATION;
CRYSTAL STRUCTURE;
DESORPTION;
ELECTRIC ACTIVITY;
ELECTRON;
ELECTRONICS INDUSTRY;
ELECTROSPRAY MASS SPECTROMETRY;
ENERGY YIELD;
FRAGMENTATION REACTION;
IMAGE ANALYSIS;
IMAGING SYSTEM;
IONIZATION;
MASS SPECTROMETRY;
MATRIX ASSISTED LASER DESORPTION IONIZATION TIME OF FLIGHT MASS SPECTROMETRY;
METAMORPHOSIS;
MOLECULAR INTERACTION;
REACTION ANALYSIS;
REVIEW;
STATISTICAL SIGNIFICANCE;
SURFACE PROPERTY;
|
EID: 16244363702
PISSN: 00032700
EISSN: None
Source Type: Journal
DOI: 10.1021/ac053355f Document Type: Review |
Times cited : (375)
|
References (25)
|