ToF-SIMS imaging and depth profiling of HeLa cells treated with bromodeoxyuridine

Surface and Interface Analysis

Volumn 43, Issue 1-2, 2011, Pages 354-357

  Brison, Jeremy ^c   Benoit, Danielle S W ^b   Muramoto, Shin ^c   Robinson, Michael ^c   Stayton, Patrick S ^b   Castner, David G ^a  

^a UNIVERSITY OF WASHINGTON   (United States)

^b University of Washington   (United States)

^c University of Washington   (United States)

Author keywords

BrdU; bromodeoxyuridine; C60; depth profiling; dual beam; HeLa cells; imaging; ToF SIMS

Indexed keywords

BRDU; BROMODEOXYURIDINE; C60; DUAL BEAM; HELA CELL; IMAGING; TOF SIMS;

ATOMIC FORCE MICROSCOPY; BIOLOGICAL MATERIALS; ETCHING; SECONDARY ION MASS SPECTROMETRY; TWO DIMENSIONAL;

DEPTH PROFILING;

EID: 78951479671     PISSN: 01422421     EISSN: 10969918     Source Type: Journal    
DOI: 10.1002/sia.3415     Document Type: Conference Paper

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