Time-of-flight secondary ion mass spectrometry: Techniques and applications for the characterization of biomaterial surfaces

Biomaterials

Volumn 24, Issue 21, 2003, Pages 3635-3653

  Belu, Anna M ^a,b   Graham, Daniel J ^a   Castner, David G ^a  

^a UNIVERSITY OF WASHINGTON   (United States)

^b MEDTRONIC INC   (United States)

Author keywords

Biomaterials; Imaging; Multivariate analysis; Surface characterization; TOF SIMS

Indexed keywords

COMPOSITION; DATA ACQUISITION; MOLECULAR ORIENTATION; MOLECULAR STRUCTURE; SECONDARY ION MASS SPECTROMETRY; SURFACE CHEMISTRY;

CHEMICAL STATE IMAGING;

BIOMATERIALS;

BIOMATERIAL; ION; POLYMER; POLYMETHACRYLIC ACID;

ANALYZER; CHEMICAL STRUCTURE; ELECTRICITY; IMAGING; IMPLANT; MASS SPECTROMETRY; MULTIVARIATE ANALYSIS; PRIORITY JOURNAL; QUANTITATIVE ANALYSIS; REVIEW; SAMPLE; SPECTRUM; STRUCTURE ANALYSIS; SURFACE PROPERTY; TECHNIQUE; TIME OF FLIGHT SECONDARY MASS SPECTROMETRY;

EID: 0038462129     PISSN: 01429612     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0142-9612(03)00159-5     Document Type: Review

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