Analysis of thin films and molecular orientation using cluster SIMS

Surface and Interface Analysis

Volumn 43, Issue 9, 2011, Pages 1224-1230

  Green, Felicia M ^a   Seah, Martin P ^a   Gilmore, Ian S ^a   Salter, Tara L ^a   Spencer, Steve J ^a  

^a NATIONAL PHYSICAL LABORATORY   (United Kingdom)

Author keywords

cluster SIMS; molecular orientation; phenylalanine; polyatomic; primary ion beam clusters; static SIMS

Indexed keywords

CLUSTER SIMS; PHENYLALANINE; POLYATOMICS; PRIMARY ION BEAM CLUSTERS; STATIC SIMS;

AMINO ACIDS; BISMUTH; ION BEAMS; IONS; MONOLAYERS; SEMICONDUCTING SILICON COMPOUNDS; SILICON WAFERS; THIN FILMS;

MOLECULAR ORIENTATION;

EID: 80051611785     PISSN: 01422421     EISSN: 10969918     Source Type: Journal    
DOI: 10.1002/sia.3703     Document Type: Article

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