메뉴 건너뛰기




Volumn 82, Issue 19, 2010, Pages 8291-8299

Effects of cryogenic sample analysis on molecular depth profiles with TOF-secondary ion mass spectrometry

Author keywords

[No Author keywords available]

Indexed keywords

CYCLOSPORINE A; DAMAGE CROSS-SECTION; DRUG MOLECULES; ION YIELDS; LOW TEMPERATURES; MOLECULAR DEPTH; MOLECULAR IONS; MOLECULAR PROFILING; ORGANIC MATERIALS; PHOSPHATIDYLCHOLINE; PROTONATED; ROLE OF WATER; ROOM TEMPERATURE; SAMPLE ANALYSIS; SAMPLE TEMPERATURE; SECONDARY ION YIELD; SPECTRAL CHANGE; STEADY STATE; TIME OF FLIGHT SECONDARY ION MASS SPECTROMETRY; YIELD ENHANCEMENT;

EID: 77957295177     PISSN: 00032700     EISSN: None     Source Type: Journal    
DOI: 10.1021/ac101746h     Document Type: Article
Times cited : (43)

References (48)
  • 38
    • 0002623954 scopus 로고    scopus 로고
    • Fundamental Aspects of Organic SIMS
    • Vickerman, J. C. and Briggs, D., Eds. Surface Spectra and IM Publications: Chichester
    • Delcorte, A. Fundamental Aspects of Organic SIMS. In TOF-SIMS: Surface Analysis by Mass Spectrometry; Vickerman, J. C. and Briggs, D., Eds.; Surface Spectra and IM Publications: Chichester, 2001; p 161-194.
    • (2001) TOF-SIMS: Surface Analysis by Mass Spectrometry , pp. 161-194
    • Delcorte, A.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.