Characterization and ion-induced degradation of cross-linked poly(methyl methacrylate) studied using time of flight secondary ion mass spectrometry

Applied Surface Science

Volumn 253, Issue 5, 2006, Pages 2603-2610

  Wagner, M S ^a   Lenghaus, K ^a   Gillen, G ^a   Tarlov, M J ^a  

^a NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

Author keywords

Depth profiling; Ethylene glycol dimethacrylate; Methyl methacrylate; SF 5 +; ToF SIMS

Indexed keywords

CROSSLINKING; DEGRADATION; GLYCOLS; ION BOMBARDMENT; MONOMERS; SECONDARY ION MASS SPECTROMETRY;

DEPTH PROFILING; ETHYLENE GLYCOL DIMETHACRYLATE; METHYL METHACRYLATE; SF5+; TOF-SIMS;

POLYMETHYL METHACRYLATES;

EID: 33751428751     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.apsusc.2006.05.022     Document Type: Article

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