What causes high resistivity in CdTe

New Journal of Physics

Volumn 14, Issue , 2012, Pages

  Biswas, Koushik ^a   Du, Mao Hua ^a  

^a OAK RIDGE NATIONAL LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CARRIER COMPENSATION; CARRIER TRAPS; CDTE; DEEP DONOR; FERMI LEVEL PINNING; FREE CARRIER DENSITY; HIGH RESISTIVITY; N-TYPE CONDUCTIVITY; NATIVE DEFECT; RADIATION DETECTION; SEMI-INSULATING; SEMICONDUCTOR BAND GAP; SHALLOW DONORS;

DEFECTS; FERMI LEVEL; SEMICONDUCTING INDIUM; SEMICONDUCTOR DOPING;

CADMIUM TELLURIDE;

EID: 84862609174     PISSN: 13672630     EISSN: None     Source Type: Journal    
DOI: 10.1088/1367-2630/14/6/063020     Document Type: Article

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