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Volumn 54, Issue 4, 2007, Pages 769-772

Crystal growth and characterization of detector grade (Cd,Zn)Te crystals

Author keywords

CdZnTe; Crystal growth; Material characterization; Radiation detector

Indexed keywords

CADMIUM; CRYSTAL GROWTH; ELECTRIC VARIABLES CONTROL; OPTIMIZATION; RADIATION DETECTORS;

EID: 34548138875     PISSN: 00189499     EISSN: None     Source Type: Journal    
DOI: 10.1109/TNS.2007.902352     Document Type: Conference Paper
Times cited : (16)

References (9)
  • 1
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    • 3-D position sensitive CdZnTe spectrometer performance using third generation VAS/TAT readout electronics
    • Dec
    • F. Zhang, Z. He, G. F. Knoll, D. K. Wehe, and J. E. Berry, "3-D position sensitive CdZnTe spectrometer performance using third generation VAS/TAT readout electronics," IEEE Trans. Nucl. Sci., vol. 52, no. 6, pp. 2009-2016, Dec. 2005.
    • (2005) IEEE Trans. Nucl. Sci , vol.52 , Issue.6 , pp. 2009-2016
    • Zhang, F.1    He, Z.2    Knoll, G.F.3    Wehe, D.K.4    Berry, J.E.5
  • 2
    • 27344453830 scopus 로고    scopus 로고
    • Fundamentals of the CdTe and CdZnTe bulk growth
    • R. Triboulet, "Fundamentals of the CdTe and CdZnTe bulk growth," Phys. Status Solidi C, vol. 2, no. 5, pp. 1556-1565, 2005.
    • (2005) Phys. Status Solidi C , vol.2 , Issue.5 , pp. 1556-1565
    • Triboulet, R.1
  • 3
    • 0028737485 scopus 로고
    • Fundamental Studies on Bridgman Growth of CdTe
    • Amsterdam, The Netherlands: Elsevier
    • P. Rudolph, "Fundamental Studies on Bridgman Growth of CdTe," in Progress in Crystal Growth and Characterization of Materials. Amsterdam, The Netherlands: Elsevier, 1994, vol. 29, pp. 275-381.
    • (1994) Progress in Crystal Growth and Characterization of Materials , vol.29 , pp. 275-381
    • Rudolph, P.1
  • 5
    • 4444358574 scopus 로고    scopus 로고
    • Comparison of undoped and doped high resistivity CdTe and (Cd,Zn)Te detector crystals
    • Aug
    • M. Fiederle, A. Fauler, J. Konrath, V. Babentsov, J. Franc, and R. B. James, "Comparison of undoped and doped high resistivity CdTe and (Cd,Zn)Te detector crystals," IEEE Trans. Nucl. Sci., vol. 51, no. 4, pp. 1864-8, Aug. 2004.
    • (2004) IEEE Trans. Nucl. Sci , vol.51 , Issue.4 , pp. 1864-1868
    • Fiederle, M.1    Fauler, A.2    Konrath, J.3    Babentsov, V.4    Franc, J.5    James, R.B.6
  • 6
    • 0037241355 scopus 로고    scopus 로고
    • A. N. Danilewsky, R. Simon, A. Fauler, M. Fiederle, and K. W. Benz, White beam X-ray topography at the synchrotron light source ANKA, research centre Karlsruhe, Nucl. Instrum. Methods Phys. Rev. B, B.199, no. 1, pp. 71-74, 2003.
    • A. N. Danilewsky, R. Simon, A. Fauler, M. Fiederle, and K. W. Benz, "White beam X-ray topography at the synchrotron light source ANKA, research centre Karlsruhe," Nucl. Instrum. Methods Phys. Rev. B, vol. B.199, no. 1, pp. 71-74, 2003.
  • 8
    • 0026237328 scopus 로고
    • Contactless evaluation of semi-insulating GaAs wafer resistivity using the time-dependent charge measurement
    • R. Stibal, J. Windscheif, and W. Jantz, "Contactless evaluation of semi-insulating GaAs wafer resistivity using the time-dependent charge measurement," Semicond Sci. Technol., vol. 6, no. 955, 1991.
    • (1991) Semicond Sci. Technol , vol.6 , Issue.955
    • Stibal, R.1    Windscheif, J.2    Jantz, W.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.