메뉴 건너뛰기




Volumn 51, Issue 3 III, 2004, Pages 1242-1249

Advances in the crystal growth and device fabrication technology of CdZnTe room temperature radiation detectors

Author keywords

CdZnTe; Charge transport; Device fabrication; Electrical compensation; Structural defects; X ray and gamma ray detectors

Indexed keywords

CHARGE CARRIERS; CHARGE TRANSFER; CRYSTAL DEFECTS; CRYSTAL GROWTH; GAMMA RAYS; SEMICONDUCTING CADMIUM TELLURIDE; SEMICONDUCTOR DOPING; X RAYS;

EID: 3342970548     PISSN: 00189499     EISSN: None     Source Type: Journal    
DOI: 10.1109/TNS.2004.829391     Document Type: Conference Paper
Times cited : (165)

References (31)
  • 2
    • 0016071415 scopus 로고
    • Undoped high-resistivity cadmium telluride for nuclear radiation detectors
    • R. Triboulet, Y. Marfaing, A. Cornet, and P. Siffert, "Undoped high-resistivity cadmium telluride for nuclear radiation detectors," J. Appl. Phys., vol. 45, pp. 2759-2765, 1974.
    • (1974) J. Appl. Phys. , vol.45 , pp. 2759-2765
    • Triboulet, R.1    Marfaing, Y.2    Cornet, A.3    Siffert, P.4
  • 3
    • 0033514183 scopus 로고    scopus 로고
    • Vapor pressure scanning implications of CdTe crystal growth
    • J. Greenberg, "Vapor pressure scanning implications of CdTe crystal growth," J. Cryst. Growth, vol. 197, pp. 406-412, 1999.
    • (1999) J. Cryst. Growth , vol.197 , pp. 406-412
    • Greenberg, J.1
  • 4
    • 20244374882 scopus 로고    scopus 로고
    • private communication
    • _, private communication.
  • 5
    • 0000473016 scopus 로고
    • Identification of the cadmium vacancy in CdTe by electron paramagnetic resonance
    • P. Emanuelsson, P. Omlig, B. K. Meyer, M. Wienecke, and M. Schenk, "Identification of the cadmium vacancy in CdTe by electron paramagnetic resonance," Phys. Rev. B, vol. 47, pp. 15578-15580, 1993.
    • (1993) Phys. Rev. B , vol.47 , pp. 15578-15580
    • Emanuelsson, P.1    Omlig, P.2    Meyer, B.K.3    Wienecke, M.4    Schenk, M.5
  • 6
    • 0037109905 scopus 로고    scopus 로고
    • Chemical trends of defect formation and doping limit in II-VI semiconductors: The case of CdTe
    • S. H. Wei and S. B. Zhang, "Chemical trends of defect formation and doping limit in II-VI semiconductors: The case of CdTe," Phys. Rev. B, vol. 66, pp. 155211-155220, 2002.
    • (2002) Phys. Rev. B , vol.66 , pp. 155211-155220
    • Wei, S.H.1    Zhang, S.B.2
  • 9
    • 0001577956 scopus 로고
    • Acceptor states in CdTe and comparison with ZnTe. General trends
    • E. Molva, J. L. Pautrat, K. Saminadayar, G. Milchberg, and N. Magnea, "Acceptor states in CdTe and comparison with ZnTe. General trends," Phys. Rev. B, vol. 30, pp. 3344-3354, 1984.
    • (1984) Phys. Rev. B , vol.30 , pp. 3344-3354
    • Molva, E.1    Pautrat, J.L.2    Saminadayar, K.3    Milchberg, G.4    Magnea, N.5
  • 10
    • 0031268896 scopus 로고    scopus 로고
    • Defects in wide band gap II-VI crystals
    • G. F. Neumark, "Defects in wide band gap II-VI crystals," Mat. Sci. Eng. R, vol. 21, pp. 1-46, 1997.
    • (1997) Mat. Sci. Eng. R , vol.21 , pp. 1-46
    • Neumark, G.F.1
  • 12
    • 0038992085 scopus 로고
    • Please cite title if available. Thank you
    • ser. EMIS Datareview, P. Capper, Ed. London, U.K.: INSPEC
    • D. J. Williams, "PLEASE CITE TITLE IF AVAILABLE. THANK YOU," in Properties of Narrow Gap Cadmium-Based Compounds. ser. EMIS Datareview, P. Capper, Ed. London, U.K.: INSPEC, 1994, pp. 505-509.
    • (1994) Properties of Narrow Gap Cadmium-based Compounds , pp. 505-509
    • Williams, D.J.1
  • 13
    • 0000010683 scopus 로고
    • Effect of deep levels on semiconductor carrier concentrations in the case of "strong" compensation
    • G. F. Neumark, "Effect of deep levels on semiconductor carrier concentrations in the case of "strong" compensation," Phys. Rev. B, vol. 26. pp. 2250-2252, 1982.
    • (1982) Phys. Rev. B , vol.26 , pp. 2250-2252
    • Neumark, G.F.1
  • 14
    • 0343738891 scopus 로고    scopus 로고
    • Growth and characterization of CdTe single crystals for radiation detectors
    • M. Funaki, T. Ozaki, K. Satoh, and R. Ohno, "Growth and characterization of CdTe single crystals for radiation detectors," Nucl. Insrtum. Meth. A, vol. 436, pp. 120-126, 1999.
    • (1999) Nucl. Insrtum. Meth. A , vol.436 , pp. 120-126
    • Funaki, M.1    Ozaki, T.2    Satoh, K.3    Ohno, R.4
  • 20
    • 0036624374 scopus 로고    scopus 로고
    • Carrier transport properties of HPB CdZnTe and THM CdTe:Cl
    • June
    • K. Suzuki, S. Seto, T. Sawada, and K. Imai, "Carrier transport properties of HPB CdZnTe and THM CdTe:Cl," IEEE Trans. Nucl. Sci., vol. 49, pp. 1287-1291, June 2002.
    • (2002) IEEE Trans. Nucl. Sci. , vol.49 , pp. 1287-1291
    • Suzuki, K.1    Seto, S.2    Sawada, T.3    Imai, K.4
  • 22
    • 34547723673 scopus 로고
    • Single-polarity charge sensing in ionization detectors using coplanar electrodes
    • P. N. Luke, "Single-polarity charge sensing in ionization detectors using coplanar electrodes," Appl. Phys. Lett., vol. 65, pp. 2884-2886, 1994.
    • (1994) Appl. Phys. Lett. , vol.65 , pp. 2884-2886
    • Luke, P.N.1
  • 23
    • 4244180299 scopus 로고
    • Charge transport in arrays of semiconductor gamma-ray detectors
    • H. H. Barrett, J. D. Eskin, and H. B. Barber, "Charge transport in arrays of semiconductor gamma-ray detectors," Phys. Rev. Lett., vol. 75, pp. 156-159, 1995.
    • (1995) Phys. Rev. Lett. , vol.75 , pp. 156-159
    • Barrett, H.H.1    Eskin, J.D.2    Barber, H.B.3
  • 24
    • 0032685817 scopus 로고    scopus 로고
    • Optimum spectroscopic performance from CZT γ- And X-ray detectors with pad and strip segmentation
    • A. Shor, Y. Eisen, and I. Mardor, "Optimum spectroscopic performance from CZT γ- and X-ray detectors with pad and strip segmentation," Nucl. Instrum. Meth. A, vol. 428, pp. 182-192, 1999.
    • (1999) Nucl. Instrum. Meth. A , vol.428 , pp. 182-192
    • Shor, A.1    Eisen, Y.2    Mardor, I.3
  • 25
    • 0032404459 scopus 로고    scopus 로고
    • Growth and properties of semi-insulating CdZnTe for radiation detector applications
    • Cs. Szeles and M. C. Driver, "Growth and properties of semi-insulating CdZnTe for radiation detector applications," SPIE Proc. Ser., vol. 3446, pp. 1-9, 1998.
    • (1998) SPIE Proc. Ser. , vol.3446 , pp. 1-9
    • Szeles, Cs.1    Driver, M.C.2
  • 26
    • 18644381735 scopus 로고    scopus 로고
    • Electron trapping nonuniformity in high-pressure-Bridgman-grown CdZnTe
    • M. Amman, J. S. Lee, and P. N. Luke, "Electron trapping nonuniformity in high-pressure-Bridgman-grown CdZnTe," J. Appl. Phys., vol, 92, pp. 3198-3206, 2002.
    • (2002) J. Appl. Phys. , vol.92 , pp. 3198-3206
    • Amman, M.1    Lee, J.S.2    Luke, P.N.3
  • 27
    • 0031630041 scopus 로고    scopus 로고
    • Current issues of high-pressure Bridgman growth of semi-insulating CdZnTe
    • Warrendale
    • Cs. Szeles and E. E. Eissler, "Current issues of high-pressure Bridgman growth of semi-insulating CdZnTe," in MRS Symp. Proc., vol. 487, Warrendale, 1998, pp. 3-12.
    • (1998) MRS Symp. Proc. , vol.487 , pp. 3-12
    • Szeles, Cs.1    Eissler, E.E.2
  • 28
    • 0036816251 scopus 로고    scopus 로고
    • Advances in the crystal growth of semi-insulating CdZnTe for radiation detector applications
    • Oct
    • Cs. Szeles, S. E. Cameron, J.-O. Ndap, and W. C. Chalmers, "Advances in the crystal growth of semi-insulating CdZnTe for radiation detector applications," IEEE Trans. Nucl. Sci., vol. 49, pp. 2535-2540, Oct. 2002.
    • (2002) IEEE Trans. Nucl. Sci. , vol.49 , pp. 2535-2540
    • Szeles, Cs.1    Cameron, S.E.2    Ndap, J.-O.3    Chalmers, W.C.4
  • 29
    • 85047172177 scopus 로고    scopus 로고
    • Development of the high-pressure electro-dynamic gradient crystal growth technology for semi-insulating CdZnTe growth for radiation detector applications
    • submitted for publication
    • C. Szeles, S. E. Cameron, S. A. Soldner, J.-O. Ndap, and M. D. Reed, "Development of the high-pressure electro-dynamic gradient crystal growth technology for semi-insulating CdZnTe growth for radiation detector applications," J. Electron. Mater., submitted for publication.
    • J. Electron. Mater.
    • Szeles, C.1    Cameron, S.E.2    Soldner, S.A.3    Ndap, J.-O.4    Reed, M.D.5


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.