Microscopic structure of DX centers in Cd0.8Zn0.2 Te:Cl

Physical Review Letters

Volumn 79, Issue 22, 1997, Pages 4473-4476

  Shan, Y Y ^a   Lynn, K G ^a   Szeles, Cs ^b   Asoka Kumar, P ^c   Thio, T ^d   Bennett, J W ^d   Beling, C B ^e   Fung, S ^e   Becla, P ^f  

^a WASHINGTON STATE UNIVERSITY   (United States)

^b II VI Inc   (United States)

^c BROOKHAVEN NATIONAL LABORATORY   (United States)

^d NEC LABORATORIES AMERICA   (United States)

^e UNIVERSITY OF HONG KONG   (Hong Kong)

^f Massachusetts Institute of Technology Cambridge   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC SPECTROSCOPY; CADMIUM COMPOUNDS; CHEMICAL BONDS; CHLORINE; ELECTRIC CONDUCTIVITY MEASUREMENT; ELECTRONS; PHOTOCONDUCTIVITY;

PHOTOEXCITATION; POSITRON ANNIHILATION SPECTROSCOPY; POSITRON TRAPPING; THERMAL BARRIER; THERMOELECTRIC TRANSPORT MEASUREMENT;

CRYSTAL ATOMIC STRUCTURE;

EID: 0031360279     PISSN: 00319007     EISSN: 10797114     Source Type: Journal    
DOI: 10.1103/PhysRevLett.79.4473     Document Type: Article

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