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Journal of Applied Physics

Volumn 108, Issue 5, 2010, Pages

First-principles study of native defects in TlBr: Carrier trapping, compensation, and polarization phemomenon

(1) Du, Mao Hua a

a OAK RIDGE NATIONAL LABORATORY (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CARRIER TRAPPING; ELECTRON TRAPPING; FIRST-PRINCIPLES CALCULATION; FIRST-PRINCIPLES STUDY; HIGH RESISTIVITY; LOW ENERGIES; MATERIAL PROPERTY; NATIVE DEFECT; ROOM TEMPERATURE; SCHOTTKY DEFECTS;

ELECTRON TRAPS;

DEFECTS;

EID: 77956818586 PISSN: 00218979 EISSN: None Source Type: Journal
DOI: 10.1063/1.3476564 Document Type: Article

Times cited : (38)

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