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Volumn 85, Issue 16, 2012, Pages

Hall and Seebeck measurement of a p-n layer stack: Determining InN bulk hole transport properties in the presence of a strong surface electron accumulation layer

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EID: 84860279840     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.85.165205     Document Type: Article
Times cited : (31)

References (26)
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    • O. Bierwagen, S. Choi, and J. S. Speck, Phys. Rev. B PRBMDO 1098-0121 10.1103/PhysRevB.84.235302 84, 235302 (2011).
    • (2011) Phys. Rev. B , vol.84 , pp. 235302
    • Bierwagen, O.1    Choi, S.2    Speck, J.S.3
  • 20
    • 41649095482 scopus 로고    scopus 로고
    • Hole mobility in Mg-doped p -type InN films
    • DOI 10.1063/1.2906374
    • X. Wang, S.-B. Che, Y. Ishitani, and A. Yoshikawa, Appl. Phys. Lett. APPLAB 0003-6951 10.1063/1.2906374 92, 132108 (2008). (Pubitemid 351483649)
    • (2008) Applied Physics Letters , vol.92 , Issue.13 , pp. 132108
    • Wang, X.1    Che, S.-B.2    Ishitani, Y.3    Yoshikawa, A.4


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.