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Volumn 82, Issue 11, 2003, Pages 1736-1738

Surface charge accumulation of InN films grown by molecular-beam epitaxy

Author keywords

[No Author keywords available]

Indexed keywords

CAPACITANCE MEASUREMENT; HALL EFFECT; MOLECULAR BEAM EPITAXY; SEMICONDUCTING INDIUM COMPOUNDS; SURFACE DISCHARGES;

METAL CONTACTS;

SEMICONDUCTING FILMS;

EID: 0037451297 PISSN: 00036951 EISSN: None Source Type: Journal
DOI: 10.1063/1.1562340 Document Type: Article

Times cited : (314)

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