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Applied Physics Letters

Volumn 94, Issue 15, 2009, Pages

Dissipation-factor-based criterion for the validity of carrier-type identification by capacitance-voltage measurements

(5) Bierwagen, O a Nagata, T a Ive, T a Van De Walle, C G a Speck, J S a

a University of California (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ANALYTICAL MODELS; CAPACITANCE VOLTAGES; CAPACITANCE-VOLTAGE MEASUREMENTS; DISSIPATION FACTORS; ELECTRONIC MATERIALS; EQUIVALENT CIRCUIT MODELS; HIGH SERIES RESISTANCES; P -TYPE CONDUCTIVITIES; PARALLEL CIRCUITS; PARALLEL CONDUCTANCES; SCHOTTKY DIODES; SERIES CIRCUITS; VOLTAGE CURVES; ZNO;

CIRCUIT THEORY; SCHOTTKY BARRIER DIODES; VOLTAGE MEASUREMENT; ZINC OXIDE;

CAPACITANCE;

EID: 65249152955 PISSN: 00036951 EISSN: None Source Type: Journal
DOI: 10.1063/1.3120562 Document Type: Article

Times cited : (11)

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