SCOPUS 정보 검색 플랫폼

Physical Review B - Condensed Matter and Materials Physics

Volumn 84, Issue 23, 2011, Pages

Hall and Seebeck profiling: Determining surface, interface, and bulk electron transport properties in unintentionally doped InN

(3) Bierwagen, Oliver a,b Choi, Soojeong a Speck, James S a

a University of California (United States)

b PAUL DRUDE INSTITUT FÜR FESTKÖRPERELEKTRONIK (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 84855413746 PISSN: 10980121 EISSN: 1550235X Source Type: Journal
DOI: 10.1103/PhysRevB.84.235302 Document Type: Article

Times cited : (30)

References (31)

1
- 0002425321
- L. J. van der Pauw, Philips Research Reports 13, 1 (1958).
- (1958) Philips Research Reports , vol.13 , pp. 1
- Van Der Pauw, L.J.¹

2
- 0347607188
- JAPIAU 0021-8979 10.1063/1.1289784
- H. Shibata and J. Oide, J. Appl. Phys. JAPIAU 0021-8979 10.1063/1.1289784 88, 4813 (2000).
- (2000) J. Appl. Phys. , vol.88 , pp. 4813
- Shibata, H.¹ Oide, J.²

3
- 11244292389
- Mobility and carrier density in materials with anisotropic conductivity revealed by van der Pauw measurements [55]
- DOI 10.1103/PhysRevB.70.165307, 165307
- O. Bierwagen, R. Pomraenke, S. Eilers, and W. T. Masselink, Phys. Rev. B PRBMDO 1098-0121 10.1103/PhysRevB.70.165307 70, 165307 (2004). (Pubitemid 40100474)
- (2004) Physical Review B - Condensed Matter and Materials Physics , vol.70 , Issue.16 , pp. 1-6
- Bierwagen, O.¹ Pomraenke, R.² Eilers, S.³ Masselink, W.T.⁴

4
- 57849124586
- APPLAB 0003-6951 10.1063/1.3052930
- O. Bierwagen, T. Ive, C. G. Van de Walle, and J. S. Speck, Appl. Phys. Lett. APPLAB 0003-6951 10.1063/1.3052930 93, 242108 (2008).
- (2008) Appl. Phys. Lett. , vol.93 , pp. 242108
- Bierwagen, O.¹ Ive, T.² Van De Walle, C.G.³ Speck, J.S.⁴

5
- 36149009949
- PHRVAO 0031-899X 10.1103/PhysRev.110.1254
- R. L. Petritz, Phys. Rev. PHRVAO 0031-899X 10.1103/PhysRev.110.1254 110, 1254 (1958).
- (1958) Phys. Rev. , vol.110 , pp. 1254
- Petritz, R.L.¹

6
- 0037451297
- APPLAB 0003-6951 10.1063/1.1562340
- H. Lu, W. J. Schaff, L. F. Eastman, and C. E. Stutz, Appl. Phys. Lett. APPLAB 0003-6951 10.1063/1.1562340 82, 1736 (2003).
- (2003) Appl. Phys. Lett. , vol.82 , pp. 1736
- Lu, H.¹ Schaff, W.J.² Eastman, L.F.³ Stutz, C.E.⁴

7
- 1442355676
- PRLTAO 0031-9007 10.1103/PhysRevLett.92.036804
- I. Mahboob, T. D. Veal, C. F. McConville, H. Lu, and W. J. Schaff, Phys. Rev. Lett. PRLTAO 0031-9007 10.1103/PhysRevLett.92.036804 92, 036804 (2004).
- (2004) Phys. Rev. Lett. , vol.92 , pp. 036804
- Mahboob, I.¹ Veal, T.D.² McConville, C.F.³ Lu, H.⁴ Schaff, W.J.⁵

8
- 77955732857
- APPLAB 0003-6951 10.1063/1.3475400
- W. Liu, R. J. N. Tan, C. B. Soh, and S. J. Chua, Appl. Phys. Lett. APPLAB 0003-6951 10.1063/1.3475400 97, 042110 (2010).
- (2010) Appl. Phys. Lett. , vol.97 , pp. 042110
- Liu, W.¹ Tan, R.J.N.² Soh, C.B.³ Chua, S.J.⁴

9
- 3342884539
- JCRGAE 0022-0248 10.1016/j.jcrysgro.2004.05.030
- C. H. Swartz, R. P. Tompkins, N. C. Giles, T. H. Myers, H. Lu, W. J. Schaff, and L. F. Eastman, J. Cryst. Growth JCRGAE 0022-0248 10.1016/j.jcrysgro.2004.05.030 269, 29 (2004).
- (2004) J. Cryst. Growth , vol.269 , pp. 29
- Swartz, C.H.¹ Tompkins, R.P.² Giles, N.C.³ Myers, T.H.⁴ Lu, H.⁵ Schaff, W.J.⁶ Eastman, L.F.⁷

10
- 27344443035
- Demonstration of nearly non-degenerate electron conduction in InN grown by molecular beam epitaxy
- DOI 10.1002/pssc.200461333
- C. H. Swartz, R. P. Tomkins, T. H. Myers, H. Lu, and W. J. Schaff, Phys. Status Solidi C JCRGAE 1610-1634 10.1002/pssc.200461333 2, 2250 (2005). (Pubitemid 41524904)
- (2005) Physica Status Solidi C: Conferences , vol.2 , Issue.7 , pp. 2250-2253
- Swartz, C.H.¹ Tomkins, R.P.² Myers, T.H.³ Lu, H.⁴ Schaff, W.J.⁵

11
- 34247599408
- Characterisation of multiple carrier transport in indium nitride grown by molecular beam epitaxy
- DOI 10.1143/JJAP.45.L1090
- T. B. Fehlberg, G. A. Umana-Membreno, B. D. Nener, G. Parish, C. S. Gallinat, G. Koblmuller, S. Rajan, S. Bernardis, and J. S. Speck, Jpn. J. Appl. Phys., Part 2 JAPLD8 0021-4922 10.1143/JJAP.45.L1090 45, L1090 (2006). (Pubitemid 47245066)
- (2006) Japanese Journal of Applied Physics, Part 2: Letters , vol.45 , Issue.37-41
- Fehlberg, T.B.¹ Umana-Membreno, G.A.² Nener, B.D.³ Parish, G.⁴ Gallinat, C.S.⁵ Koblmuller, G.⁶ Rajan, S.⁷ Bernardis, S.⁸ Speck, J.S.⁹

12
- 42249110530
- JECMA5 0361-5235 10.1007/s11664-007-0345-8
- T. B. Fehlberg, C. S. Gallinat, G. A. Umana-Membreno, G. Koblmueller, B. D. Nener, J. S. Speck, and G. Parish, J. Electron. Mater. JECMA5 0361-5235 10.1007/s11664-007-0345-8 37, 593 (2008).
- (2008) J. Electron. Mater. , vol.37 , pp. 593
- Fehlberg, T.B.¹ Gallinat, C.S.² Umana-Membreno, G.A.³ Koblmueller, G.⁴ Nener, B.D.⁵ Speck, J.S.⁶ Parish, G.⁷

13
- 74349091618
- PHYBE3 0921-4526 10.1016/j.physb.2009.08.242
- N. Miller, Physica B PHYBE3 0921-4526 10.1016/j.physb.2009.08.242 404, 4862 (2009).
- (2009) Physica B , vol.404 , pp. 4862
- Miller, N.¹

14
- 65549122431
- JCOMEL 0953-8984 10.1088/0953-8984/21/17/174201
- P. D. C. King, T. D. Veal, and C. F. McConville, J. Phys. Condens. Matter JCOMEL 0953-8984 10.1088/0953-8984/21/17/174201 21, 174201 (2009).
- (2009) J. Phys. Condens. Matter , vol.21 , pp. 174201
- King, P.D.C.¹ Veal, T.D.² McConville, C.F.³

15
- 79961243363
- PRBMDO 1098-0121 10.1103/PhysRevB.84.035205
- T. A. Komissarova, V. N. Jmerik, S. V. Ivanov, O. Drachenko, X. Wang, and A. Yoshikawa, Phys. Rev. B PRBMDO 1098-0121 10.1103/PhysRevB.84.035205 84, 035205 (2011).
- (2011) Phys. Rev. B , vol.84 , pp. 035205
- Komissarova, T.A.¹ Jmerik, V.N.² Ivanov, S.V.³ Drachenko, O.⁴ Wang, X.⁵ Yoshikawa, A.⁶

16
- 80052481853
- PRBMDO 1098-0121 10.1103/PhysRevB.84.075315
- N. Miller, E. E. Haller, G. Koblmüller, C. Gallinat, J. S. Speck, W. J. Schaff, M. E. Hawkridge, K. M. Yu, and J. W. Ager, Phys. Rev. B PRBMDO 1098-0121 10.1103/PhysRevB.84.075315 84, 075315 (2011).
- (2011) Phys. Rev. B , vol.84 , pp. 075315
- Miller, N.¹ Haller, E.E.² Koblmüller, G.³ Gallinat, C.⁴ Speck, J.S.⁵ Schaff, W.J.⁶ Hawkridge, M.E.⁷ Yu, K.M.⁸ Ager, J.W.⁹

17
- 0037438326
- PRBMDO 1098-0121 10.1103/PhysRevB.67.045314
- B. Arnaudov, T. Paskova, S. Evtimova, E. Valcheva, M. Heuken, and B. Monemar, Phys. Rev. B PRBMDO 1098-0121 10.1103/PhysRevB.67.045314 67, 045314 (2003).
- (2003) Phys. Rev. B , vol.67 , pp. 045314
- Arnaudov, B.¹ Paskova, T.² Evtimova, S.³ Valcheva, E.⁴ Heuken, M.⁵ Monemar, B.⁶

18
- 0014554413
- JAPIAU 0021-8979 10.1063/1.1658260
- R. Baron, G. A. Shifrin, O. J. Marsh, and J. W. Mayer, J. Appl. Phys. JAPIAU 0021-8979 10.1063/1.1658260 40, 3702 (1969).
- (1969) J. Appl. Phys. , vol.40 , pp. 3702
- Baron, R.¹ Shifrin, G.A.² Marsh, O.J.³ Mayer, J.W.⁴

19
- 0040174984
- JPSIAE 0022-3735 10.1088/0022-3735/21/5/011
- S. R. Blight, R. E. Nicholls, S. P. S. Sangha, P. B. Kirby, L. Teale, S. P. Hiscock, and C. P. Stewart, J. Phys. E JPSIAE 0022-3735 10.1088/0022-3735/21/ 5/011 21, 470 (1988).
- (1988) J. Phys. e , vol.21 , pp. 470
- Blight, S.R.¹ Nicholls, R.E.² Sangha, S.P.S.³ Kirby, P.B.⁴ Teale, L.⁵ Hiscock, S.P.⁶ Stewart, C.P.⁷

20
- 0031337914
- SSELA5 0038-1101 10.1016/S0038-1101(97)00173-1
- C. B. Vartuli, S. J. Pearton, C. R. Abernathy, J. D. MacKenzie, F. Ren, J. C. Zolper, and R. J. Shul, Solid-State Electron. SSELA5 0038-1101 10.1016/S0038-1101(97)00173-1 41, 1947 (1997).
- (1997) Solid-State Electron. , vol.41 , pp. 1947
- Vartuli, C.B.¹ Pearton, S.J.² Abernathy, C.R.³ MacKenzie, J.D.⁴ Ren, F.⁵ Zolper, J.C.⁶ Shul, R.J.⁷

21
- 60449096765
- JAPIAU 0021-8979 10.1063/1.3073930
- A. Denisenko, C. Pietzka, A. Chuvilin, U. Kaiser, H. Lu, W. J. Schaff, and E. Kohn, J. Appl. Phys. JAPIAU 0021-8979 10.1063/1.3073930 105, 033702 (2009).
- (2009) J. Appl. Phys. , vol.105 , pp. 033702
- Denisenko, A.¹ Pietzka, C.² Chuvilin, A.³ Kaiser, U.⁴ Lu, H.⁵ Schaff, W.J.⁶ Kohn, E.⁷

22
- 0003624373
- Springer, New York
- K. Seeger, Semiconductor Physics, 9th ed. (Springer, New York, 2004).
- (2004) Semiconductor Physics
- Seeger, K.¹

23
- 70450274966
- JAPIAU 0021-8979 10.1063/1.3254241
- M. E. White, O. Bierwagen, M. Y. Tsai, and J. S. Speck, J. Appl. Phys. JAPIAU 0021-8979 10.1063/1.3254241 106, 093704 (2009).
- (2009) J. Appl. Phys. , vol.106 , pp. 093704
- White, M.E.¹ Bierwagen, O.² Tsai, M.Y.³ Speck, J.S.⁴

24
- 50849097034
- JVTAD6 0734-2101 10.1116/1.2966423
- M. E. White, M. Y. Tsai, F. Wu, and J. S. Speck, J. Vac. Sci. Technol. A JVTAD6 0734-2101 10.1116/1.2966423 26, 1300 (2008).
- (2008) J. Vac. Sci. Technol. A , vol.26 , pp. 1300
- White, M.E.¹ Tsai, M.Y.² Wu, F.³ Speck, J.S.⁴

25
- 77952774537
- JVTAD6 1882-0778 10.1143/APEX.3.051101
- M. E. White, O. Bierwagen, M.-Y. Tsai, and J. S. Speck, Appl. Phys. Express JVTAD6 1882-0778 10.1143/APEX.3.051101 3, 051101 (2010).
- (2010) Appl. Phys. Express , vol.3 , pp. 051101
- White, M.E.¹ Bierwagen, O.² Tsai, M.-Y.³ Speck, J.S.⁴

26
- 77956027433
- APPLAB 0003-6951 10.1063/1.3480416
- O. Bierwagen and J. S. Speck, Appl. Phys. Lett. APPLAB 0003-6951 10.1063/1.3480416 97, 072103 (2010).
- (2010) Appl. Phys. Lett. , vol.97 , pp. 072103
- Bierwagen, O.¹ Speck, J.S.²

27
- 71749113602
- PHYBE3 0921-4526 10.1016/j.physb.2009.09.042
- V. Darakchieva, Physica B PHYBE3 0921-4526 10.1016/j.physb.2009.09.042 404, 4476 (2009).
- (2009) Physica B , vol.404 , pp. 4476
- Darakchieva, V.¹

28
- 67650733476
- APPLAB 0003-6951 10.1063/1.3173202
- C. S. Gallinat, G. Koblmueller, and J. S. Speck, Appl. Phys. Lett. APPLAB 0003-6951 10.1063/1.3173202 95, 022103 (2009).
- (2009) Appl. Phys. Lett. , vol.95 , pp. 022103
- Gallinat, C.S.¹ Koblmueller, G.² Speck, J.S.³

29
- 79951931842
- APPLAB 0003-6951 10.1063/1.3553772
- E. Kalesaki, J. Kioseoglou, L. Lymperakis, P. Komninou, and T. Karakostas, Appl. Phys. Lett. APPLAB 0003-6951 10.1063/1.3553772 98, 072103 (2011).
- (2011) Appl. Phys. Lett. , vol.98 , pp. 072103
- Kalesaki, E.¹ Kioseoglou, J.² Lymperakis, L.³ Komninou, P.⁴ Karakostas, T.⁵

30
- 33645527344
- PRLTAO 0031-9007 10.1103/PhysRevLett.96.125505
- R. E. Jones, K. M. Yu, S. X. Li, W. Walukiewicz, J. W. Ager, E. E. Haller, H. Lu, and W. J. Schaff, Phys. Rev. Lett. PRLTAO 0031-9007 10.1103/PhysRevLett.96.125505 96, 125505 (2006).
- (2006) Phys. Rev. Lett. , vol.96 , pp. 125505
- Jones, R.E.¹ Yu, K.M.² Li, S.X.³ Walukiewicz, W.⁴ Ager, J.W.⁵ Haller, E.E.⁶ Lu, H.⁷ Schaff, W.J.⁸

31
- 77953623658
- JAPIAU 0021-8979 10.1063/1.3427564
- N. Miller, J. Appl. Phys. JAPIAU 0021-8979 10.1063/1.3427564 107, 113712 (2010).
- (2010) J. Appl. Phys. , vol.107 , pp. 113712
- Miller, N.¹

* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.