Ultra-precise characterization of LCLS hard Xray focusing mirrors by high resolution slope measuring deflectometry

Optics Express

Volumn 20, Issue 4, 2012, Pages 4525-4536

  Siewert, Frank ^a   Buchheim, Jana ^a   Boutet, Sébastien ^b   Williams, Garth J ^b   Montanez, Paul A ^b   Krzywinski, Jacek ^b   Signorato, Riccardo ^c  

^a HAHN MEITNER INSTITUT   (Germany)

^b SLAC NATIONAL ACCELERATOR LABORATORY   (United States)

^c Bruker ASC GmbH   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

LIGHT SOURCES; MIRRORS;

COHERENT X-RAYS; CRITICAL STEPS; DEFLECTOMETRY; DIFFRACTION LIMITED; ELLIPTICAL MIRRORS; FIGURE ERROR; HARD X RAY; HARD-X-RAY FOCUSING; HIGH RESOLUTION; KIRKPATRICK-BAEZ MIRROR; LINAC COHERENT LIGHT SOURCE; SHAPE-PRESERVING; SLOPE ERRORS;

OPTICAL TESTING;

EID: 84857322883     PISSN: None     EISSN: 10944087     Source Type: Journal    
DOI: 10.1364/OE.20.004525     Document Type: Article

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