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Volumn 1234, Issue , 2010, Pages 433-436

The holography endstation of beamline P10 at PETRA III

b DESY (Germany)

Author keywords

Coherent X ray Diffractive Imaging; Synchrotron Instrumentation; X ray Holography; X ray Microscopy

Indexed keywords

EID: 77955037066 PISSN: 0094243X EISSN: 15517616 Source Type: Conference Proceeding
DOI: 10.1063/1.3463233 Document Type: Conference Paper

Times cited : (16)

References (10)

1
- 33845751556
- C. Fuhse, C. Ollinger, and T. Salditt, Physical Review Letters 97, 254801 (2006).
- (2006) Physical Review Letters , vol.97 , pp. 254801
- Fuhse, C.¹ Ollinger, C.² Salditt, T.³

2
- 33646690297
- ISSN 1745-2473
- H. M. Quiney, A. G. Peele, Z. Cai, D. Paterson, and K. A. Nugent, Nat Phys 2, 101-104 (2006), ISSN 1745-2473.
- (2006) Nat Phys , vol.2 , pp. 101-104
- Quiney, H.M.¹ Peele, A.G.² Cai, Z.³ Paterson, D.⁴ Nugent, K.A.⁵

3
- 18144431722
- A. Jarre, C. Fuhse, C. Ollinger, J. Seeger, R. Tucoulou, and T. Salditt, Phys. Rev. Lett. 94, 074801 (2005).
- (2005) Phys. Rev. Lett. , vol.94 , pp. 074801
- Jarre, A.¹ Fuhse, C.² Ollinger, C.³ Seeger, J.⁴ Tucoulou, R.⁵ Salditt, T.⁶

4
- 43249101466
- T. Salditt, S. P. Kruger, C. Fuhse, and C. Bahtz, Phys. Rev. Lett. 100, 184801-4 (2008).
- (2008) Phys. Rev. Lett. , vol.100 , pp. 184801-184804
- Salditt, T.¹ Kruger, S.P.² Fuhse, C.³ Bahtz, C.⁴

5
- 34248172982
- C. Ponchut, J. Clément, J.-M. Rigal, E. Papillon, J. Vallerga, D. LaMarra, and B. Mikulec, Nuclear Instruments and Methods in Physics Research Section A 576, 109-112 (2007).
- (2007) Nuclear Instruments and Methods in Physics Research Section A , vol.576 , pp. 109-112
- Ponchut, C.¹ Clément, J.² Rigal, J.-M.³ Papillon, E.⁴ Vallerga, J.⁵ LaMarra, D.⁶ Mikulec, B.⁷

6
- 67649407772
- T. Salditt, K. Giewekemeyer, C. Fuhse, S. P. Krüger, R. Tucoulou, and P. Cloetens, Physical Review B (Condensed Matter and Materials Physics) 79, 184112 (2009), URL http://link.aps.org/abstract/PRB/v79/e184112.
- (2009) Physical Review B (Condensed Matter and Materials Physics) , vol.79 , pp. 184112
- Salditt, T.¹ Giewekemeyer, K.² Fuhse, C.³ Krüger, S.P.⁴ Tucoulou, R.⁵ Cloetens, P.⁶

7
- 77955028042
- Tech. rep.
- Coherence beamline at petraiii beamline design report, Tech. rep. (2008).
- (2008) Coherence Beamline at Petraiii Beamline Design Report

8
- 33846973993
- H. Mimura, H. Yumoto, S. Matsuyama, Y. Sano, K. Yamamura, Y. Mori, M. Yabashi, Y. Nishino, K. Tamasaku, T. Ishikawa, and K. Yamauchi, Applied Physics Letters 90, 051903 (2007).
- (2007) Applied Physics Letters , vol.90 , pp. 051903
- Mimura, H.¹ Yumoto, H.² Matsuyama, S.³ Sano, Y.⁴ Yamamura, K.⁵ Mori, Y.⁶ Yabashi, M.⁷ Nishino, Y.⁸ Tamasaku, K.⁹ Ishikawa, T.¹⁰ Yamauchi, K.¹¹

9
- 77950850815
- The Nanometer Optical Component Measuring Machine: A new Sub-nm Topography Measuring Device for X-ray Optics at BESSY
- F. Siewert, T. Noll, T. Schlegel, T. Zeschke, and H. Lammert, "The Nanometer Optical Component Measuring Machine: a new Sub-nm Topography Measuring Device for X-ray Optics at BESSY," AIP, 2004, vol. 705, pp. 847-850.
- AIP, 2004 , vol.705 , pp. 847-850
- Siewert, F.¹ Noll, T.² Schlegel, T.³ Zeschke, T.⁴ Lammert, H.⁵

10
- 56549099844
- Y. Li, R. Beck, T. Huang, M. C. Choi, and M. Divinagracia, Journal of Applied Crystallography 41, 1134-1139 (2008).
- (2008) Journal of Applied Crystallography , vol.41 , pp. 1134-1139
- Li, Y.¹ Beck, R.² Huang, T.³ Choi, M.C.⁴ Divinagracia, M.⁵

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