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1
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The Nanometer Optical Component Measuring Machine - NOM - at BESSY
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399-402 BESSY, Berlin;
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H. Lammert, T. Noll, T. Schlegel, F. Siewert, T. Zeschke, The Nanometer Optical Component Measuring Machine - NOM - at BESSY, BESSY Annual Report (2000) 399-402 (BESSY, Berlin; 〈www.bessy.de〉).
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BESSY Annual Report
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Lammert, H.1
Noll, T.2
Schlegel, T.3
Siewert, F.4
Zeschke, T.5
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2
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31844434573
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Breakthrough in the metrology and manufacture of optical components for synchrotron radiation
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530-533 BESSY, Berlin;
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H. Lammert, T. Noll, T. Schlegel, F. Senf, F. Siewert, T. Zeschke, Breakthrough in the metrology and manufacture of optical components for synchrotron radiation, BESSY Annual Report (2003) 530-533 (BESSY, Berlin; 〈www.bessy.de〉).
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BESSY Annual Report
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Lammert, H.1
Noll, T.2
Schlegel, T.3
Senf, F.4
Siewert, F.5
Zeschke, T.6
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3
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77950850815
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Siewert F., Noll T., Schlegel T., Zeschke T., and Lammert H. AIP Conf. Proc. 705 (2004) 847
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Schlegel, T.3
Zeschke, T.4
Lammert, H.5
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4
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31844453293
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Siewert F., Lammert H., Noll T., Schlegel T., Zeschke T., Hänsel T., Nickel A., Schindler A., Grubert B., and Schlewitt C. Proc. SPIE 5921 (2005) 5921011
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Noll, T.3
Schlegel, T.4
Zeschke, T.5
Hänsel, T.6
Nickel, A.7
Schindler, A.8
Grubert, B.9
Schlewitt, C.10
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6
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33947355007
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Siewert F., Lammert H., Reichardt G., Hahn U., Treusch R., and Reininger R. AIP Conf. Proc. 879 (2007) 667
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(2007)
AIP Conf. Proc.
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Siewert, F.1
Lammert, H.2
Reichardt, G.3
Hahn, U.4
Treusch, R.5
Reininger, R.6
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7
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77950796251
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The nanometer optical component measuring machine
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Erko A., Idir M., Krist T., and Michette A.G. (Eds), Springer, Berlin, Heidelberg
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Siewert F., Lammert H., and Zeschke T. The nanometer optical component measuring machine. In: Erko A., Idir M., Krist T., and Michette A.G. (Eds). Modern Developments in X-ray and Neutron Optics (2008), Springer, Berlin, Heidelberg
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Siewert, F.1
Lammert, H.2
Zeschke, T.3
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8
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42149119162
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Yashchuk V.V., McKinney W.R., Warwick T., Noll T., Siewert F., Zeschke T., and Geckeler R.D. Proc. SPIE 6704 (2007) 67040A1
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(2007)
Proc. SPIE
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Yashchuk, V.V.1
McKinney, W.R.2
Warwick, T.3
Noll, T.4
Siewert, F.5
Zeschke, T.6
Geckeler, R.D.7
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9
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77950830697
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Initial alignment and commissioning of an autocollimator based slope measuring profiler at the Advanced Light Source
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BESSY, Berlin;
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F. Siewert, V.V. Yashchuk, W.R. McKinney, J.L. Kirschman, G.Y. Morrison, B.V. Smith, Initial alignment and commissioning of an autocollimator based slope measuring profiler at the Advanced Light Source, BESSY Annual Report (2008) (BESSY, Berlin; 〈www.bessy.de〉).
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(2008)
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Siewert, F.1
Yashchuk, V.V.2
McKinney, W.R.3
Kirschman, J.L.4
Morrison, G.Y.5
Smith, B.V.6
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10
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77950979143
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V.V. Yashchuk, S. Barber, E.E. Domning, J.L. Kirschman, G.Y. Morrison, B.V. Smith, F. Siewert, T. Zeschke, R.D. Geckeler, A. Just, Sub-microradian surface slope metrology with the ALS developmental long trace profiler, Nucl. Instr. and Meth. A, this issue, doi:10.1016/j.nima.2009.10.175
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V.V. Yashchuk, S. Barber, E.E. Domning, J.L. Kirschman, G.Y. Morrison, B.V. Smith, F. Siewert, T. Zeschke, R.D. Geckeler, A. Just, Sub-microradian surface slope metrology with the ALS developmental long trace profiler, Nucl. Instr. and Meth. A, this issue, doi:10.1016/j.nima.2009.10.175
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20
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77950833156
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Guide 99:1993: International vocabulary of metrology-basic and general concepts and associated terms (VIM), definition
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ISO/IEC 6.10, ISO, Geneva
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ISO/IEC Guide 99:1993: International vocabulary of metrology-basic and general concepts and associated terms (VIM), definition 6.10. (ISO, Geneva, 1993).
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(1993)
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21
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Probst R., Wittekopf R., Krause M., Dangschat H., and Ernst A. Meas. Sci. Technol. 9 (1998) 1059
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22
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Guide to the Expression of Uncertainty in Measurement (ISO, Geneva, 1993).
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Guide to the Expression of Uncertainty in Measurement (ISO, Geneva, 1993).
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Just A., Krause M., Probst R., Bosse H., Haunerdinger H., Spaeth Ch., Metz G., and Israel W. Precis. Eng. 33 (2009) 530
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Kirschman J.L., Smith B.V., Domning E.E., Irick S.C., MacDowell A.A., McKinney W.R., Morrison G.Y., Smith B.V., Warwick T., and Yashchuk V.V. Proc. SPIE 6317 (2007) 67040J1
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Smith, B.V.2
Domning, E.E.3
Irick, S.C.4
MacDowell, A.A.5
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Morrison, G.Y.7
Smith, B.V.8
Warwick, T.9
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V.V. Yashchuk, Optimal measurement strategies for effective suppression of drift errors, Rev. Sci. Instrum. 80 (2009) 115101-1-10
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V.V. Yashchuk, Optimal measurement strategies for effective suppression of drift errors, Rev. Sci. Instrum. 80 (2009) 115101-1-10
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33
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77950810301
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Autokollimationsfernrohr und Verfahren zur Abbildung einer Messmarke hierfür,
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patent DE102005018983, 26.10
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G. Fütterer, Autokollimationsfernrohr und Verfahren zur Abbildung einer Messmarke hierfür, patent DE102005018983, 26.10.2006.
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Fütterer, G.1
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36
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77950793643
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Calibration
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South Korea, May 27-June 03
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F. Siewert, Calibration, In: Conference on Synchrotron Radiation Instrumentation SRI-2006, III Workshop on Optical Metrology, CD Proceedings, Daegu, South Korea, May 27-June 03, 2006
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(2006)
Conference on Synchrotron Radiation Instrumentation SRI-2006, III Workshop on Optical Metrology, CD Proceedings, Daegu
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Siewert, F.1
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40
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77950828382
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An angular reversal technique for error separation between dual axis electronic autocollimator and a PZT tilting platform
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E. Thornett Ed, European Society for Precision Engineering and Nanotechnology
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R. Probst, G. Fütterer, J. Illemann, J. Mokros, P.K. Lui, E. Bachish, An angular reversal technique for error separation between dual axis electronic autocollimator and a PZT tilting platform, in: E. Thornett (Ed.), Proceedings of the Seventh International Conference, European Society for Precision Engineering and Nanotechnology, Vol. 2, 2007, pp. 121-124.
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, vol.2
, pp. 121-124
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Probst, R.1
Fütterer, G.2
Illemann, J.3
Mokros, J.4
Lui, P.K.5
Bachish, E.6
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