메뉴 건너뛰기




Volumn 74, Issue 5, 2003, Pages 2894-2898

Microstitchino, interferometry for x-ray reflective optics

Author keywords

[No Author keywords available]

Indexed keywords

MIRRORS; REFLECTION; SYNCHROTRON RADIATION; X RAY OPTICS;

EID: 0038527372     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1569405     Document Type: Article
Times cited : (165)

References (25)
  • 7
    • 0010948314 scopus 로고    scopus 로고
    • edited by Y. Furukawa, Y. Mori, and T. Kataoka (Japan Society for Precision Engineering, Tokyo)
    • K. B. Becker, in Precision Science and Technology for Perfect Surfaces, edited by Y. Furukawa, Y. Mori, and T. Kataoka (Japan Society for Precision Engineering, Tokyo, 1999), p. 51.
    • (1999) Precision Science and Technology for Perfect Surfaces , pp. 51
    • Becker, K.B.1
  • 19
    • 0038133962 scopus 로고    scopus 로고
    • edited by Y. Furukawa, Y. Mori, and T. Kataoka (Japan Society for Precision Engineering, Tokyo)
    • H. Shiozawa and Y. Fukutomi, in Precision Science and Technology for Perfect Surfaces, edited by Y. Furukawa, Y. Mori, and T. Kataoka (Japan Society for Precision Engineering, Tokyo, 1999), p. 360.
    • (1999) Precision Science and Technology for Perfect Surfaces , pp. 360
    • Shiozawa, H.1    Fukutomi, Y.2
  • 20
    • 0035761741 scopus 로고    scopus 로고
    • M. Bray, Proc. SPIE 4451, 375 (2001).
    • (2001) Proc. SPIE , vol.4451 , pp. 375
    • Bray, M.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.