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3
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-
33947389145
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Design of FEL-Beamlines for Short Pulse, High Resolution and High Power Density
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5
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42149164905
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-
National Synchrotron Light Source II
-
National Synchrotron Light Source II, www.bnl.gov/nsls2.
-
-
-
-
6
-
-
0022062887
-
Use of an optical profiling instrument for the measurement of the figure and finish of optical quality surfaces
-
E. L. Church, P. Z. Takacs, "Use of an optical profiling instrument for the measurement of the figure and finish of optical quality surfaces," Wear, 109 (1986), 241-57.
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(1986)
Wear
, vol.109
, pp. 241-257
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-
Church, E.L.1
Takacs, P.Z.2
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7
-
-
79952535634
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Design of a long trace surface profiler
-
P. Z. Takacs, Shinan Qian, J. Colbert, "Design of a long trace surface profiler," SPIE Proc. 749 (1987), 59-64.
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(1987)
SPIE Proc
, vol.749
, pp. 59-64
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-
Takacs, P.Z.1
Qian, S.2
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8
-
-
84957512807
-
Long trace profile measurement on cylindrical aspheres
-
P. Z. Takacs, S. K. Feng, E. L. Church, S. Qian, and W. Liu, "Long trace profile measurement on cylindrical aspheres," SPIE Proc. 966, 354 (1989).
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(1989)
SPIE Proc
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, pp. 354
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-
Takacs, P.Z.1
Feng, S.K.2
Church, E.L.3
Qian, S.4
Liu, W.5
-
9
-
-
77950850815
-
The Nanometre Optical Component Measuring Machine: A new Sub-nm Topography Measuring Device for X-ray Optics at BESSY
-
F. Siewert, T. Noll, T. Schlegel, T. Zeschke, and H. Lammert, "The Nanometre Optical Component Measuring Machine: a new Sub-nm Topography Measuring Device for X-ray Optics at BESSY," AIP Conference Proceedings, 705, p.847-850 (2004).
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Siewert, F.1
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11
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-
42149171755
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-
V. V. Yashchuk, Universal Test Mirror for Calibration of Long Trace Profilers: Proposal, Light Source Note LSBL-800 (ALS, LBNL, Berkeley, October 17, 2006).
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V. V. Yashchuk, "Universal Test Mirror for Calibration of Long Trace Profilers: Proposal," Light Source Note LSBL-800 (ALS, LBNL, Berkeley, October 17, 2006).
-
-
-
-
12
-
-
85010160969
-
Advancements in one-dimensional profiling with a long trace profiler
-
S. C. Irick. W. R. McKinney, "Advancements in one-dimensional profiling with a long trace profiler," SPIE Proc. 1720 (1992), 162-8.
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(1992)
SPIE Proc
, vol.1720
, pp. 162-168
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-
Irick, S.C.1
McKinney, W.R.2
-
13
-
-
36449001810
-
Using a straightness reference in obtaining more accurate surface profiles from a long trace profiler (for synchrotron optics)
-
S. C. Irick, W. R. McKinney, D. L. Lunt, P. Z. Takacs, "Using a straightness reference in obtaining more accurate surface profiles from a long trace profiler (for synchrotron optics)," Rev. Sci. Instrum., 63(1), 1436-8 (1992).
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(1992)
Rev. Sci. Instrum
, vol.63
, Issue.1
, pp. 1436-1438
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-
Irick, S.C.1
McKinney, W.R.2
Lunt, D.L.3
Takacs, P.Z.4
-
14
-
-
4244031396
-
Improved measurement accuracy in a long trace profiler: Compensation for laser pointing instability
-
S. C. Irick, "Improved measurement accuracy in a long trace profiler: compensation for laser pointing instability," Nucl. Instrum. & Meth. A 347(1-3), 226-30 (1994).
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(1994)
Nucl. Instrum. & Meth. A
, vol.347
, Issue.1-3
, pp. 226-230
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-
Irick, S.C.1
-
15
-
-
0040150909
-
Determine surface profile from sequential interference patterns from a long tracer profiler (for synchrotron optics)
-
S. C. Irick, "Determine surface profile from sequential interference patterns from a long tracer profiler (for synchrotron optics)," Rev. Sci. Instrum. 63(1) (1992) 1432-5.
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(1992)
Rev. Sci. Instrum
, vol.63
, Issue.1
, pp. 1432-1435
-
-
Irick, S.C.1
-
16
-
-
0029728701
-
Penta-Prism Long Trace Profiler (PPLTP) for measurement of grazing incidence space optics
-
Shinan Qian, H. Li, P. Z. Takacs, "Penta-Prism Long Trace Profiler (PPLTP) for measurement of grazing incidence space optics," SPIE Proc. 2805 (1996), 108-14.
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(1996)
SPIE Proc
, vol.2805
, pp. 108-114
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-
Shinan Qian, H.1
Li, P.Z.T.2
-
17
-
-
0033308248
-
Large-mirror figure measurement by optical profilometry techniques
-
P. Z. Takacs, Shinan Qian, T. Kester, H. Li, "Large-mirror figure measurement by optical profilometry techniques," SPIE Proc. 3782 (1999), 266-74.
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(1999)
SPIE Proc
, vol.3782
, pp. 266-274
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-
Takacs, P.Z.1
Qian, S.2
Kester, T.3
Li, H.4
-
18
-
-
0033342736
-
Precision calibration and systematic error reduction in the Long Trace Profiler
-
Shinan Qian, G. Sostero, P. Z. Takacs, "Precision calibration and systematic error reduction in the Long Trace Profiler," SPIE Proc. 3782 (1999), 627-36.
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(1999)
SPIE Proc
, vol.3782
, pp. 627-636
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-
Shinan Qian, G.1
Sostero, P.Z.T.2
-
19
-
-
0033888254
-
Precision calibration and systematic error reduction in the long trace profiler
-
Shinan Qian, Sostero G, P. Z. Takacs, "Precision calibration and systematic error reduction in the long trace profiler," Optical Engineering, 39(1) (2000), 304-10.
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(2000)
Optical Engineering
, vol.39
, Issue.1
, pp. 304-310
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-
Shinan Qian, S.G.1
Takacs, P.Z.2
-
20
-
-
28844475936
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Accuracy limitations in long-trace profilometry
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P. Z. Takacs, Shinan Qian, "Accuracy limitations in long-trace profilometry," AIP Conference Proceedings, 708, 831-4 (2004).
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(2004)
AIP Conference Proceedings
, vol.708
, pp. 831-834
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-
Takacs, P.Z.1
Qian, S.2
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21
-
-
0000637816
-
The penta-prism LTP: A long-trace-profiler with stationary optical head and moving penta prism
-
Shinan Qian, W. Jark, P. Z. Takacs, "The penta-prism LTP: a long-trace-profiler with stationary optical head and moving penta prism," Rev. Sci. Instrum. 66(3) (1995), 2562-9.
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(1995)
Rev. Sci. Instrum
, vol.66
, Issue.3
, pp. 2562-2569
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-
Shinan Qian, W.1
Jark, P.Z.T.2
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22
-
-
0000616448
-
Significant improvements in long trace profiler measurement performance
-
P. Z. Takacs, C. J. Bresloff, "Significant improvements in long trace profiler measurement performance," SPIE Proc. 2856, 236-45 (1996).
-
(1996)
SPIE Proc
, vol.2856
, pp. 236-245
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-
Takacs, P.Z.1
Bresloff, C.J.2
-
23
-
-
0038800777
-
Improvements in the accuracy and the repeatability of long trace profiler measurements
-
P. Z. Takacs, E. L. Church, C. J. Bresloff, L. Assoufid, "Improvements in the accuracy and the repeatability of long trace profiler measurements," Applied Optics, 38(25), 5468-79 (1999).
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(1999)
Applied Optics
, vol.38
, Issue.25
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-
Takacs, P.Z.1
Church, E.L.2
Bresloff, C.J.3
Assoufid, L.4
-
24
-
-
0038002955
-
Equal optical path beam splitter for a pencil beam interferometer and shearing interferometer
-
Shinan Qian, P. Z. Takacs, "Equal optical path beam splitter for a pencil beam interferometer and shearing interferometer," Optical Engineering 42(4), 929-34 (2003).
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(2003)
Optical Engineering
, vol.42
, Issue.4
, pp. 929-934
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-
Shinan Qian, P.Z.T.1
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25
-
-
28844458366
-
Elimination of 'ghost'-effect-related systematic errors in metrology of X-ray optics with a long trace profiler
-
V. V. Yashchuk, S. C. Irick, A. A. MacDowell, "Elimination of 'ghost'-effect-related systematic errors in metrology of X-ray optics with a long trace profiler," SPIE Proc. 5858, 261-268 (2005).
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(2005)
SPIE Proc
, vol.5858
, pp. 261-268
-
-
Yashchuk, V.V.1
Irick, S.C.2
MacDowell, A.A.3
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26
-
-
33750581508
-
Positioning Errors of Pencil-beam Interferometers for Long Trace Profilers
-
V.V. Yashchuk, "Positioning Errors of Pencil-beam Interferometers for Long Trace Profilers," SPIE Proc. 6317-10, (2006).
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(2006)
SPIE Proc. 6317-10
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-
Yashchuk, V.V.1
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27
-
-
33750581508
-
Air convection noise of pencilbeam interferometer for long-trace profiler
-
V. V. Yashchuk, S. C. Irick, A. A. MacDowell, W. R. McKinney, P. Z. Takacs, "Air convection noise of pencilbeam interferometer for long-trace profiler," SPIE Proc. 6317-13, 2006.
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(2006)
SPIE Proc. 6317-13
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-
Yashchuk, V.V.1
Irick, S.C.2
MacDowell, A.A.3
McKinney, W.R.4
Takacs, P.Z.5
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28
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-
33750630882
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ESAD shearing deflectometry: Potentials for synchrotron beamline metrolog
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R. G. Geckeler, "ESAD shearing deflectometry: potentials for synchrotron beamline metrolog," SPIE Proc. 6317, 63171H (2006).
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SPIE Proc
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Geckeler, R.G.1
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31
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42149087891
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Precision Tiltmeter as a Reference for Slope Measuring Instruments
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this
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J. L. Kirschman, E. E. Domning, G. Y. Morrison, B. V. Smith, V. V. Yashchuk, "Precision Tiltmeter as a Reference for Slope Measuring Instruments," SPIE Proc. 6704-08 (2007) - this volume.
-
(2007)
SPIE Proc. 6704-08
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-
Kirschman, J.L.1
Domning, E.E.2
Morrison, G.Y.3
Smith, B.V.4
Yashchuk, V.V.5
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33
-
-
42149101657
-
Flat-field calibration of CCD detector for Long Trace Profiler
-
this
-
J. L. Kirschman, E. E. Domning, K. D. Franck, S. C. Irick, A. A. McDowell, W. R. McKinney, G. Y. Morrison, B. V. Smith, T. Warwick, V. V. Yashchuk, "Flat-field calibration of CCD detector for Long Trace Profiler," SPIE Proc. 6704-18 (2007) - this volume.
-
(2007)
SPIE Proc. 6704-18
-
-
Kirschman, J.L.1
Domning, E.E.2
Franck, K.D.3
Irick, S.C.4
McDowell, A.A.5
McKinney, W.R.6
Morrison, G.Y.7
Smith, B.V.8
Warwick, T.9
Yashchuk, V.V.10
-
34
-
-
0342882616
-
Angle Calibration of the Long Trace Profiler Using a Diffraction Grating,
-
LSBL-160
-
S. C. Irick, "Angle Calibration of the Long Trace Profiler Using a Diffraction Grating," LSBL Report LSBL-160 (1992).
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(1992)
LSBL Report
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Irick, S.C.1
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37
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31844453293
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Advanced metrology, an essential support for the surface finishing of high performance x-ray optics
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F. Siewert, H. Lammert, T. Noll, T. Schelegel, T. Zeschke, T. Hansel, A. Nickel, A. Schindler, B. Grubert, C. Schlewitt, "Advanced metrology, an essential support for the surface finishing of high performance x-ray optics," SPIE Proc. 5921-01 (2005).
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(2005)
SPIE Proc. 5921-01
-
-
Siewert, F.1
Lammert, H.2
Noll, T.3
Schelegel, T.4
Zeschke, T.5
Hansel, T.6
Nickel, A.7
Schindler, A.8
Grubert, B.9
Schlewitt, C.10
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38
-
-
42149139086
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-
Physik Instrumente L.P., model M-227 (Physik Instrumente GmbH & Co: www.physikinstrumente.com).
-
Physik Instrumente L.P., model M-227 (Physik Instrumente GmbH & Co: www.physikinstrumente.com).
-
-
-
-
39
-
-
42149150995
-
-
Heidenhain CERTO, model CP60K (HEIDENHAIN Co.: www.heidenhain.com).
-
Heidenhain CERTO, model CP60K (HEIDENHAIN Co.: www.heidenhain.com).
-
-
-
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