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Volumn 616, Issue 2-3, 2010, Pages 224-228

The Diamond-NOM: A non-contact profiler capable of characterizing optical figure error with sub-nanometre repeatability

Author keywords

Autocollimator; Diamond NOM; Metrology; Optical testing; Pentaprism; Synchrotron; X ray optics

Indexed keywords

AUTOCOLLIMATOR; AUTOCOLLIMATORS; ELASTIC EMISSION MACHINING; FIGURE ERROR; NANOMETRE RESOLUTION; NANOMETRES; NON-CONTACT PROFILERS; OPTICAL ASSEMBLIES; OPTICAL METROLOGY; SLOPE ERRORS; SYNCHROTRON MIRRORS; SYNCHROTRON X RAYS;

EID: 77950871847     PISSN: 01689002     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.nima.2009.10.137     Document Type: Article
Times cited : (164)

References (11)
  • 5
    • 77950877714 scopus 로고
    • United States Patent 4884697
    • P.Z. Takacs, S. Qian, United States Patent 4884697, 1989.
    • (1989)
    • Takacs, P.Z.1    Qian, S.2
  • 10
    • 77950903382 scopus 로고    scopus 로고
    • Advances in metrology for X-ray and EUV optics II
    • S.G. Alcock, K.J.S. Sawhney, Advances in metrology for X-ray and EUV optics II, Proc. SPIE (2007) 6704.
    • (2007) Proc. SPIE , pp. 6704
    • Alcock, S.G.1    Sawhney, K.J.S.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.