Second metrology round-robin of APS, ESRF and SPring-8 laboratories of elliptical and spherical hard-x-ray mirrors

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 6704, Issue , 2007, Pages

  Rommeveaux, A ^a   Assoufid, L ^b   Ohashi, H ^c   Mimura, H ^d   Yamauchi, K ^d   Qian, J ^b   Ishikawa, T ^c,e   Morawe, C ^a   Macrander, A T ^b   Khounsary, A ^b   Goto, S ^c  

^a EUROPEAN SYNCHROTRON RADIATION FACILITY   (France)

^b ARGONNE NATIONAL LABORATORY   (United States)

^c JAPAN SYNCHROTRON RADIATION RESEARCH INSTITUTE   (Japan)

^d OSAKA UNIVERSITY   (Japan)

^e RIKEN SPring 8 Center   (Japan)

Author keywords

Interferometer; Long trace profiler; Round robin; Stitching; X ray mirrors

Indexed keywords

INTERFEROMETERS; INTERFEROMETRY; X RAYS;

LONG TRACE PROFILER (LTP); MICRO-STITCHING INTERFEROMETRY; X-RAY MIRRORS;

MIRRORS;

EID: 42149154056     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.736171     Document Type: Conference Paper

References (13)

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