Requirements on hard x-ray grazing incidence optics for european XFEL: analysis and simulation of wavefront transformations

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 7360, Issue , 2009, Pages

  Samoylova, Liubov ^a   Sinn, Harald ^a   Siewert, Frank ^b   Mimura, Hidekazu ^c   Yamauchi, Kazuto ^c   Tschentscher, Thomas ^a  

^a DESY   (Germany)

^b HAHN MEITNER INSTITUT   (Germany)

^c OSAKA UNIVERSITY   (Japan)

Author keywords

Coherent beam; Grazing incidence X ray optics; X ray FEL

Indexed keywords

ANALYSIS AND SIMULATION; BEAM-LINES; COHERENT BEAM; COHERENT BEAMS; FAR FIELD APPROXIMATION; GRAZING INCIDENCE X-RAY OPTICS; HARD X RAY; HIGH PRECISION; LOCAL SURFACES; MIRROR SURFACES; NUMERICAL SIMULATION; SLOPE ERRORS; SPATIAL FREQUENCY; SURFACE PROFILES; WAVE OPTICS; WAVEFIELDS; X-RAY FEL;

COMPUTER SIMULATION; ERRORS; FREE ELECTRON LASERS; MIRRORS; ULTRAVIOLET DEVICES; X RAY OPTICS;

X RAYS;

EID: 69949190490     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.822251     Document Type: Conference Paper

References (9)

1. M. Altarelli, et al. (Eds.) XFEL, The European X-ray Free-Electron Laser, Technical Design Report, (DESY 2006- 097) (2006).
2. M. Born, E. Wolf, Principles of Optics, 6th edition, Pergamon Press, Oxford (1980).
3. A. Papoulis, Systems and Transforms with Applications in Optics, McGraw-Hill (1968).
4. J. Bahrdt, "Wavefront tracking within the stationary phase approximation" Physical Review Special Topics 10 (2007) 060701(15).
5. O.Chubar, P. Elleaume, "Accurate and efficient computation of synchrotron radiation in the near field region", in Proceedings of EPAC-98 (1998) 1177.
6. K. Tiedke, et al, "The soft x-ray free-electron laser FLASH at DESY: beamlines, diagnostics and end-stations, " New Journal of Physics 11 (2009) 023029.
7. F. Siewert, "BESSY Measurement Report for a 510mm Plane Mirror for FLASH/DESY September 2006", F. Siewert, K.Tiedtke, (private communication).
8. F. Siewert, et al., AIP Conf. Proc. "The Nanometer Optical Component Measuring Machine: a new sub-nm Topography Measuring Device for X-ray Optics at BESSY" 705 (2004) 847-850; H. Lammert, T. Noll, T. Schlegel, F. Siewert, T. Zeschke, Patent No.: DE 103 03 659 (28 July 2005).
9. K. Yamauchi, K. Yamamura, H. Mimura, Y. Sano, A. Saito, K. Endo, A. Souvorov, M. Yabashi, K. Tamasaku, T. Ishikawa, Y. Mori "Wave-optical evaluation of interference fringes and wavefront phase in a hard-x-ray beam totally reflected by mirror optics, " Appl. Opt. 44, 6927-6934 (2005).