메뉴 건너뛰기




Volumn 27, Issue 1, 2012, Pages 248-257

A fast loss and temperature simulation method for power converters, part I: Electrothermal modeling and validation

Author keywords

Compact modeling; Mission profile; Power converter losses; Temperature profiles

Indexed keywords

COMPACT MODELING; CONVERTER LOSS; DEVICE TEMPERATURE; ELECTRO-THERMAL MODELING; FAST SIMULATION METHODS; LOAD CYCLE; MISSION PROFILE; PHYSICS-BASED MODELS; POWER CONVERTER LOSSES; SIMPLIFIED MODELS; SIMULATION TIME; TEMPERATURE PROFILES; TEMPERATURE SIMULATIONS;

EID: 83655164761     PISSN: 08858993     EISSN: None     Source Type: Journal    
DOI: 10.1109/TPEL.2011.2148729     Document Type: Article
Times cited : (65)

References (34)
  • 3
    • 0033339607 scopus 로고    scopus 로고
    • Fast power cycling test for insulated gate bipolar transistor modules in traction application
    • M. Held, P. Jacob, G. Nicoletti, P. Scacco, and M.-H. Poech, "Fast power cycling test for insulated gate bipolar transistor modules in traction applications," Int. J. Electron., vol. 86, no. 10, pp. 1193-1204, 1999. (Pubitemid 30508546)
    • (1999) International Journal of Electronics , vol.86 , Issue.10 , pp. 1193-1204
    • Held, M.1    Jacob, P.2    Nicoletti, G.3    Scacco, P.4    Poech, M.-H.5
  • 5
    • 79953751298 scopus 로고    scopus 로고
    • First power cycling results of improved packaging technologies for hybrid electrical vehicle applications
    • Nuremberg, Germany, Mar.
    • A. Hensler, J. Lutz, M. Thoben, and K. Guth, "First power cycling results of improved packaging technologies for hybrid electrical vehicle applications," in Proc. Conf. Integr. Power Electron. Syst. Rec., Nuremberg, Germany, Mar. 2010, pp. 85-89.
    • (2010) Proc. Conf. Integr. Power Electron. Syst. Rec. , pp. 85-89
    • Hensler, A.1    Lutz, J.2    Thoben, M.3    Guth, K.4
  • 6
    • 33745926566 scopus 로고    scopus 로고
    • The influence of operating conditions on multi-objective optimization of power electronic devices and circuits
    • presented at the, Hong Kong, Oct.
    • A. Bryant, D. Jaeggi, G. Parks, and P. Palmer, "The influence of operating conditions on multi-objective optimization of power electronic devices and circuits," presented at the Int. AIDS Society Conf. Rec., Hong Kong, Oct. 2005.
    • (2005) Int. AIDS Society Conf. Rec.
    • Bryant, A.1    Jaeggi, D.2    Parks, G.3    Palmer, P.4
  • 7
    • 34547915611 scopus 로고    scopus 로고
    • Simulation and optimisation of diode and IGBT interaction in a chopper cell using MATLAB and Simulink
    • Jul.
    • A. Bryant, P. Palmer, E. Santi, and J. Hudgins, "Simulation and optimisation of diode and IGBT interaction in a chopper cell using MATLAB and Simulink," IEEE Trans. Ind. Appl., vol. 43, no. 4, pp. 902-910, Jul. 2007.
    • (2007) IEEE Trans. Ind. Appl. , vol.43 , Issue.4 , pp. 902-910
    • Bryant, A.1    Palmer, P.2    Santi, E.3    Hudgins, J.4
  • 9
    • 80053482342 scopus 로고
    • A dynamic electro-thermalmodel for the IGBT
    • Mar.
    • A. Hefner, "A dynamic electro-thermalmodel for the IGBT," IEEE Trans. Ind. Appl., vol. 30, no. 2, pp. 394-405, Mar. 1994.
    • (1994) IEEE Trans. Ind. Appl. , vol.30 , Issue.2 , pp. 394-405
    • Hefner, A.1
  • 10
    • 0026141845 scopus 로고
    • A simple diode model with reverse recovery
    • Apr.
    • P. Lauritzen, "A simple diode model with reverse recovery," IEEE Trans. Power Electron., vol. 6, no. 2, pp. 188-191, Apr. 1991.
    • (1991) IEEE Trans. Power Electron. , vol.6 , Issue.2 , pp. 188-191
    • Lauritzen, P.1
  • 11
    • 34748889482 scopus 로고    scopus 로고
    • Computationally efficient integration of complex thermal multi-chip power module models into circuit simulators
    • presented at the, Nagoya, Japan, Apr.
    • U. Drofenik, D. Cottet, A. Musing, J.-M. Meyer, and J. Kolar, "Computationally efficient integration of complex thermal multi-chip power module models into circuit simulators," presented at the Power Conversion Conf. Rec., Nagoya, Japan, Apr. 2007.
    • (2007) Power Conversion Conf. Rec.
    • Drofenik, U.1    Cottet, D.2    Musing, A.3    Meyer, J.-M.4    Kolar, J.5
  • 12
    • 33748041125 scopus 로고    scopus 로고
    • Compact modelling and analysis of power-sharing unbalances in IGBT-modules used in traction applications
    • DOI 10.1016/j.microrel.2006.07.055, PII S0026271406001995, Proceedings of the 17th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis
    • A. Castellazzi, M. Ciappa, W. Fichtner, G. Lourdel, and M. Mermet- Guyennet, "Compact modelling and analysis of power-sharing unbalances in IGBT-modules used in traction applications," Microelectron. Reliabil., vol. 46, pp. 1754-1759, 2006. (Pubitemid 44294694)
    • (2006) Microelectronics Reliability , vol.46 , Issue.9-11 , pp. 1754-1759
    • Castellazzi, A.1    Ciappa, M.2    Fichtner, W.3    Lourdel, G.4    Mermet-Guyennet, M.5
  • 15
    • 84855260851 scopus 로고    scopus 로고
    • May 25, [Online]. Available, Web address
    • PLECS Simulator. (May 25, 2010). [Online]. Available: Web address: http://www.plexim.com/.
    • (2010) PLECS Simulator
  • 16
    • 47249159485 scopus 로고    scopus 로고
    • Modeling nonisothermal characteristics of switch-mode voltage regulators
    • Jul.
    • K. Górecki and J. Zarbski, "Modeling nonisothermal characteristics of switch-mode voltage regulators," IEEE Trans. Power Electron., vol. 23, no. 4, pp. 1848-1858, Jul. 2008.
    • (2008) IEEE Trans. Power Electron. , vol.23 , Issue.4 , pp. 1848-1858
    • Górecki, K.1    Zarbski, J.2
  • 17
    • 83655164762 scopus 로고    scopus 로고
    • A fast loss and temperature simulation method for power converters. Part II: 3-D thermal model of power module
    • to be published
    • I. Swan, A. Bryant, P. Mawby, T. Ueta, T. Nishijima, and K. Hamada, "A fast loss and temperature simulation method for power converters. Part II: 3-D thermal model of power module," IEEE Trans. Power Electron., to be published.
    • IEEE Trans. Power Electron.
    • Swan, I.1    Bryant, A.2    Mawby, P.3    Ueta, T.4    Nishijima, T.5    Hamada, K.6
  • 18
    • 44849104314 scopus 로고    scopus 로고
    • Exploration of power device reliability using compact device models and fast electrothermal simulation
    • DOI 10.1109/TIA.2008.921388
    • A. Bryant, P. Mawby, P. Palmer, E. Santi, and J. Hudgins, "Exploration of power device reliability using compact device models and fast electrothermal simulation," IEEE Trans. Industry Applications, vol. 44, no. 3, pp. 894-903, May 2008. (Pubitemid 351796136)
    • (2008) IEEE Transactions on Industry Applications , vol.44 , Issue.3 , pp. 894-903
    • Bryant, A.T.1    Mawby, P.A.2    Palmer, P.R.3    Santi, E.4    Hudgins, J.L.5
  • 19
    • 58049117248 scopus 로고    scopus 로고
    • Fast inverter loss and temperature simulation and silicon carbide device evaluation for hybrid electric vehicle drives
    • Apr.
    • A. Bryant, G. Roberts, A. Walker, P. Mawby, T. Ueta, T. Nisijima, and K. Hamada, "Fast inverter loss and temperature simulation and silicon carbide device evaluation for hybrid electric vehicle drives," IEEJ Trans. D: Ind. Appl., vol. 128, no. 4, pp. 441-449, Apr. 2008.
    • (2008) IEEJ Trans. D: Ind. Appl. , vol.128 , Issue.4 , pp. 441-449
    • Bryant, A.1    Roberts, G.2    Walker, A.3    Mawby, P.4    Ueta, T.5    Nisijima, T.6    Hamada, K.7
  • 20
    • 79953732212 scopus 로고    scopus 로고
    • Fast extraction of dynamic thermal impedance formulti-chip powermodules
    • presented at the, Nuremberg, Germany, Mar.
    • P. Evans and C. Johnson, "Fast extraction of dynamic thermal impedance formulti-chip powermodules," presented at the Conf. on Integrated Power Electronics System Rec., Nuremberg, Germany, Mar. 2010.
    • (2010) Conf. on Integrated Power Electronics System Rec.
    • Evans, P.1    Johnson, C.2
  • 21
    • 2342490774 scopus 로고    scopus 로고
    • Automatic generation of compact electro-thermal models for semiconductor devices
    • T. Bechtold, E. Rudnyi, and J. Korvink, "Automatic generation of compact electro-thermal models for semiconductor devices," IEICE Trans. Electron., vol. E86C, no. 3, pp. 459-465, 2003.
    • (2003) IEICE Trans. Electron. , vol.E86C , Issue.3 , pp. 459-465
    • Bechtold, T.1    Rudnyi, E.2    Korvink, J.3
  • 22
    • 2442534670 scopus 로고    scopus 로고
    • A 2D physically based compact model for advanced power bipolar devices
    • P. Igic, M. Towers, and P. Mawby, "A 2D physically based compact model for advanced power bipolar devices," Microelectron. J., vol. 35, pp. 591-594, 2004.
    • (2004) Microelectron. J. , vol.35 , pp. 591-594
    • Igic, P.1    Towers, M.2    Mawby, P.3
  • 23
    • 0036697722 scopus 로고    scopus 로고
    • New physically-based PiN diode compact model for circuit modelling applications
    • Aug.
    • P. Igic, P. Mawby, M. Towers, and S. Batcup, "New physically-based PiN diode compact model for circuit modelling applications," IEE Proc.-Circuits Devices Syst., vol. 149, no. 4, pp. 257-263, Aug. 2002.
    • (2002) IEE Proc.-Circuits Devices Syst. , vol.149 , Issue.4 , pp. 257-263
    • Igic, P.1    Mawby, P.2    Towers, M.3    Batcup, S.4
  • 24
    • 0027835731 scopus 로고
    • A modular concept for the circuit simulation of bipolar power semiconductors
    • Brighton, East Sussex, U.K.
    • D. Metzner, T. Vogler, and D. Schröder, "A modular concept for the circuit simulation of bipolar power semiconductors," in Proc. Eur. Power Electron. Conf. Rec., Brighton, East Sussex, U.K., 1993, vol. 2, pp. 15-22.
    • (1993) Proc. Eur. Power Electron. Conf. Rec. , vol.2 , pp. 15-22
    • Metzner, D.1    Vogler, T.2    Schröder, D.3
  • 25
    • 77952175977 scopus 로고    scopus 로고
    • The electrothermal large-signal model of powerMOS transistors for SPICE
    • May
    • J. Zarbski and K. Górecki, "The electrothermal large-signal model of powerMOS transistors for SPICE," IEEE Trans. Power Electron., vol. 25, no. 5, pp. 1265-1274, May 2010.
    • (2010) IEEE Trans. Power Electron. , vol.25 , Issue.5 , pp. 1265-1274
    • Zarbski, J.1    Górecki, K.2
  • 28
    • 0030704831 scopus 로고    scopus 로고
    • A study of distributed switching processes in IGBTs and other power bipolar devices
    • St. Louis, MO
    • P. Leturcq, "A study of distributed switching processes in IGBTs and other power bipolar devices," in Proc. Power Electron. Spec. Conf. Rec., St. Louis, MO, 1997, vol. 1, pp. 139-147.
    • (1997) Proc. Power Electron. Spec. Conf. Rec. , vol.1 , pp. 139-147
    • Leturcq, P.1
  • 29
    • 0141787901 scopus 로고    scopus 로고
    • Circuit simulator models for the diode and IGBT with full temperature dependent features
    • Sep.
    • P. Palmer, E. Santi, J. Hudgins, X. Kang, J. Joyce, and P. Eng, "Circuit simulator models for the diode and IGBT with full temperature dependent features," IEEE Trans. Power Electron., vol. 18, no. 5, pp. 1220-1229, Sep. 2003.
    • (2003) IEEE Trans. Power Electron. , vol.18 , Issue.5 , pp. 1220-1229
    • Palmer, P.1    Santi, E.2    Hudgins, J.3    Kang, X.4    Joyce, J.5    Eng, P.6
  • 30
    • 0141643281 scopus 로고    scopus 로고
    • Characterization and modeling of high-voltage field-stop IGBTs
    • Jul./Aug.
    • X. Kang, A. Caiafa, E. Santi, J. Hudgins, and P. Palmer, "Characterization and modeling of high-voltage field-stop IGBTs," IEEE Trans. Ind. Appl., vol. 39, no. 4, pp. 922-928, Jul./Aug. 2003.
    • (2003) IEEE Trans. Ind. Appl. , vol.39 , Issue.4 , pp. 922-928
    • Kang, X.1    Caiafa, A.2    Santi, E.3    Hudgins, J.4    Palmer, P.5
  • 31
    • 38349009183 scopus 로고    scopus 로고
    • Physical modelling of fast p-i-n diodes with carrier lifetime zoning. Part I: Device model
    • Jan.
    • A. Bryant, L. Lu, E. Santi, P. Palmer, and J. Hudgins, "Physical modelling of fast p-i-n diodes with carrier lifetime zoning. Part I: Device model," IEEE Trans. Power Electron., vol. 23, no. 1, pp. 189-197, Jan. 2008.
    • (2008) IEEE Trans. Power Electron. , vol.23 , Issue.1 , pp. 189-197
    • Bryant, A.1    Lu, L.2    Santi, E.3    Palmer, P.4    Hudgins, J.5
  • 32
    • 33644910694 scopus 로고    scopus 로고
    • Two-step parameter extraction procedure with formal optimization for physics-based circuit simulator IGBT and p-i-n diode models
    • DOI 10.1109/TPEL.2005.869742
    • A. Bryant, X. Kang, E. Santi, P. Palmer, and J. Hudgins, "Two-step parameter extraction procedure with formal optimization for physics-based circuit simulator IGBT and PIN diode models," IEEE Trans. Power Electron., vol. 21, no. 2, pp. 295-309, Mar. 2006. (Pubitemid 43380078)
    • (2006) IEEE Transactions on Power Electronics , vol.21 , Issue.2 , pp. 295-309
    • Bryant, A.T.1    Kang, X.2    Santi, E.3    Palmer, P.R.4    Hudgins, J.L.5
  • 33
    • 34547915611 scopus 로고    scopus 로고
    • The use of condition maps in the design and testing of power electronic circuits and devices
    • Jul.
    • A. Bryant, N.-A. Parker-Allotey, and P. Palmer, "The use of condition maps in the design and testing of power electronic circuits and devices," IEEE Trans. Ind. Appl., vol. 43, no. 4, pp. 874-883, Jul. 2007.
    • (2007) IEEE Trans. Ind. Appl. , vol.43 , Issue.4 , pp. 874-883
    • Bryant, A.1    Parker-Allotey, N.-A.2    Palmer, P.3
  • 34
    • 0034474531 scopus 로고    scopus 로고
    • Exact inductive parasitic extraction for analysis of IGBT parallel switching including DCB-backside eddy currents
    • B. Gutsmann, P. Mourick, and D. Silber, "Exact inductive parasitic extraction for analysis of IGBT parallel switching including DCB-backside eddy currents," in Proc. Power Electron. Spec. Conf. Rec., Galway, Ireland, Jun. 2000, vol. 3, pp. 1291-1295. (Pubitemid 32190270)
    • (2000) PESC Record - IEEE Annual Power Electronics Specialists Conference , vol.3 , pp. 1291-1295
    • Gutsmann, B.1    Mourick, P.2    Silber, D.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.