메뉴 건너뛰기




Volumn 21, Issue 2, 2006, Pages 295-309

Two-step parameter extraction procedure with formal optimization for physics-based circuit simulator IGBT and p-i-n diode models

Author keywords

Insulated gate bipolar transistor (IGBT) model; Optimized parameter extraction; Parameter extraction; Power diode model; Semiconductor modeling

Indexed keywords

DIODES; INSULATED GATE BIPOLAR TRANSISTORS; OPTIMIZATION; PARAMETER ESTIMATION; SEMICONDUCTOR DEVICE MODELS;

EID: 33644910694     PISSN: 08858993     EISSN: None     Source Type: Journal    
DOI: 10.1109/TPEL.2005.869742     Document Type: Article
Times cited : (144)

References (32)
  • 2
    • 0029267581 scopus 로고
    • "Modeling buffer layer IGBTs for the circuit simulation"
    • May
    • A. R. Hefner, "Modeling buffer layer IGBTs for the circuit simulation," IEEE Trans. Power Electron., vol. 10, no. 3, pp. 111-123, May 1995.
    • (1995) IEEE Trans. Power Electron. , vol.10 , Issue.3 , pp. 111-123
    • Hefner, A.R.1
  • 4
    • 29144505545 scopus 로고
    • "An analytical model for the steady-state and transient characteristics of the power insulated-gate bipolar transistor"
    • A. R. Hefner and D. L. Blackburn, "An analytical model for the steady-state and transient characteristics of the power insulated-gate bipolar transistor," Solid-State Electron., vol. 31, no. 10, pp. 1513-1532, 1988.
    • (1988) Solid-State Electron. , vol.31 , Issue.10 , pp. 1513-1532
    • Hefner, A.R.1    Blackburn, D.L.2
  • 7
    • 0029765366 scopus 로고    scopus 로고
    • "PT-IGBT pspice model with new parameter extraction for life-time and epy dependent behavior simulation"
    • Jun
    • S. Musumeci et al., "PT-IGBT pspice model with new parameter extraction for life-time and epy dependent behavior simulation," Proc. 27th Annu. IEEE Power Electronics Specialists Conf. (PESC'96), pp. 1682-1688, Jun. 1996.
    • (1996) Proc. 27th Annu. IEEE Power Electronics Specialists Conf. (PESC'96) , pp. 1682-1688
    • Musumeci, S.1
  • 8
    • 0031335572 scopus 로고    scopus 로고
    • "Parameter extraction methodology and validation for an electro-thermal physics-based NPT IGBT model"
    • Oct
    • J. Sigg, P. Turkes, and R. Kraus, "Parameter extraction methodology and validation for an electro-thermal physics-based NPT IGBT model," in Proc. IEEE 32nd Annu. Industry Application Soc. Meeting (IAS'97), Oct. 1997, pp. 1166-1173.
    • (1997) Proc. IEEE 32nd Annu. Industry Application Soc. Meeting (IAS'97) , pp. 1166-1173
    • Sigg, J.1    Turkes, P.2    Kraus, R.3
  • 10
    • 0027886392 scopus 로고
    • "Technological parameter identification of PIN-diode using using transient signal parameter fits"
    • C.-C. Lin, B. Allard, H. Morel, and J.-P. Chante, "Technological parameter identification of PIN-diode using using transient signal parameter fits," in Proc. EPE Conf., 1993, pp. 29-33.
    • (1993) Proc. EPE Conf. , pp. 29-33
    • Lin, C.-C.1    Allard, B.2    Morel, H.3    Chante, J.-P.4
  • 11
    • 0042258662 scopus 로고    scopus 로고
    • "An automatic parameter extraction technique for an improved PIN diode circuit model"
    • Trondheim, Norway
    • A. G. M. Strollo and E. Napoli, "An automatic parameter extraction technique for an improved PIN diode circuit model," in Proc. EPE Conf., vol. 4, Trondheim, Norway, 1997, pp. 111-116.
    • (1997) Proc. EPE Conf. , vol.4 , pp. 111-116
    • Strollo, A.G.M.1    Napoli, E.2
  • 12
    • 0141787901 scopus 로고    scopus 로고
    • "Circuit simulator models for the diode and IGBT with full temperature dependent features"
    • Sep
    • P. R. Palmer, E. Santi, J. L. Hudgins, X. Kang, J. C. Joyce, and P. Y. Eng, "Circuit simulator models for the diode and IGBT with full temperature dependent features," IEEE Trans. Power Electron., vol. 18, no. 5, pp. 1220-1229, Sep. 2003.
    • (2003) IEEE Trans. Power Electron. , vol.18 , Issue.5 , pp. 1220-1229
    • Palmer, P.R.1    Santi, E.2    Hudgins, J.L.3    Kang, X.4    Joyce, J.C.5    Eng, P.Y.6
  • 14
    • 0036072956 scopus 로고    scopus 로고
    • "Parameter extraction for a power diode circuit simulator model including temperature dependent effects"
    • Dallas, TX, Mar
    • X. Kang, A. Caiafa, E. Santi, J. L. Hudgins, and P. R. Palmer, "Parameter extraction for a power diode circuit simulator model including temperature dependent effects," in Proc. IEEE Applied Power Electronics Conf. (APEC'02), Dallas, TX, Mar. 2002, pp. 452-458.
    • (2002) Proc. IEEE Applied Power Electronics Conf. (APEC'02) , pp. 452-458
    • Kang, X.1    Caiafa, A.2    Santi, E.3    Hudgins, J.L.4    Palmer, P.R.5
  • 15
    • 33644911400 scopus 로고    scopus 로고
    • "A distributed model of IGBTs for circuit simulation"
    • P. Leturcq, J.-L. Debrie, and M. O. Berraies, "A distributed model of IGBTs for circuit simulation," in Proc. EPE Conf., 1997, pp. 1494-1501.
    • (1997) Proc. EPE Conf. , pp. 1494-1501
    • Leturcq, P.1    Debrie, J.-L.2    Berraies, M.O.3
  • 16
    • 0141643281 scopus 로고    scopus 로고
    • "Characterization and modeling of high-voltage field-stop IGBTs"
    • Jul./Aug
    • X. Kang, A. Caiafa, E. Santi, J. L. Hudgins, and P. R. Palmer, "Characterization and modeling of high-voltage field-stop IGBTs," IEEE Trans. Ind. Appl., vol. 39, no. 3, pp. 922-928, Jul./Aug. 2003.
    • (2003) IEEE Trans. Ind. Appl. , vol.39 , Issue.3 , pp. 922-928
    • Kang, X.1    Caiafa, A.2    Santi, E.3    Hudgins, J.L.4    Palmer, P.R.5
  • 18
    • 0014493888 scopus 로고
    • "On the effective carrier lifetime in p-s-n rectifiers at high injection levels"
    • H. Schlangenotto and W. Gerlach, "On the effective carrier lifetime in p-s-n rectifiers at high injection levels," Solid-State Electron., vol. 12, pp. 267-275, 1969.
    • (1969) Solid-State Electron. , vol.12 , pp. 267-275
    • Schlangenotto, H.1    Gerlach, W.2
  • 19
    • 0026141845 scopus 로고
    • "A simple diode model with reverse recovery"
    • Apr
    • P. O. Lauritzen, "A simple diode model with reverse recovery," IEEE Trans. Power Electron., vol. 6, no. 2, pp. 188-191, Apr. 1991.
    • (1991) IEEE Trans. Power Electron. , vol.6 , Issue.2 , pp. 188-191
    • Lauritzen, P.O.1
  • 20
    • 0024089376 scopus 로고
    • "Determination of carrier lifetime from rectifier ramp recovery waveform"
    • Oct
    • B. Tien and C. Hu, "Determination of carrier lifetime from rectifier ramp recovery waveform," IEEE Electron Device Lett., vol. 9, no. 10, pp. 553-555, Oct. 1988.
    • (1988) IEEE Electron Device Lett. , vol.9 , Issue.10 , pp. 553-555
    • Tien, B.1    Hu, C.2
  • 21
    • 0014778389 scopus 로고
    • "Measurements of the ionization rates in diffused silicon p-n junctions"
    • R. Van Overstraeten and H. DeMan, "Measurements of the ionization rates in diffused silicon p-n junctions," Solid-State Electron., vol. 13, no. 5, pp. 583-608, 1970.
    • (1970) Solid-State Electron. , vol.13 , Issue.5 , pp. 583-608
    • Van Overstraeten, R.1    DeMan, H.2
  • 22
    • 0000047103 scopus 로고
    • "Avalanche breakdown of diffused silicon p-n junctions"
    • vol. ED-13, Dec
    • R. A. Kokosa and R. L. Davies, "Avalanche breakdown of diffused silicon p-n junctions," IEEE Trans. Electron. Devices, vol. ED-13, no. 12, pp. 874-881, Dec. 1966.
    • (1966) IEEE Trans. Electron. Devices , Issue.12 , pp. 874-881
    • Kokosa, R.A.1    Davies, R.L.2
  • 23
    • 36849106474 scopus 로고
    • "Avalanche breakdown voltages of abrupt and linearly graded p-n junctions in Ge, Si, GaAs, and GaP"
    • S. M. Sze and G. Gibbons, "Avalanche breakdown voltages of abrupt and linearly graded p-n junctions in Ge, Si, GaAs, and GaP," Appl. Phys. Lett., vol. 8, pp. 111-111, 1966.
    • (1966) Appl. Phys. Lett. , vol.8 , pp. 111
    • Sze, S.M.1    Gibbons, G.2
  • 25
    • 0037954432 scopus 로고    scopus 로고
    • "An assessment of wide bandgap semiconductors for power devices"
    • May
    • J. L. Hudgins, G. Simin, E. Santi, and M. A. Khan, "An assessment of wide bandgap semiconductors for power devices," IEEE Trans. Power Electron., vol. 18, no. 3, pp. 907-914, May 2003.
    • (2003) IEEE Trans. Power Electron. , vol.18 , Issue.3 , pp. 907-914
    • Hudgins, J.L.1    Simin, G.2    Santi, E.3    Khan, M.A.4
  • 26
    • 0019608025 scopus 로고
    • "Carrier mobilities in silicon semi-empirically related to temperature, doping and injection level"
    • J. M. Dorkel and P. Leturcq, "Carrier mobilities in silicon semi-empirically related to temperature, doping and injection level," Solid-State Electron., vol. 24, no. 9, pp. 821-825, 1981.
    • (1981) Solid-State Electron. , vol.24 , Issue.9 , pp. 821-825
    • Dorkel, J.M.1    Leturcq, P.2
  • 27
    • 0032459206 scopus 로고    scopus 로고
    • "A tabu search for the optimization of fluid power circuits"
    • Oct
    • A. M. Connor and D. G. Tilley, "A tabu search for the optimization of fluid power circuits," J. Sys. Contr. I, vol. 212, no. 5, pp. 373-381, Oct. 1998.
    • (1998) J. Sys. Contr. I , vol.212 , Issue.5 , pp. 373-381
    • Connor, A.M.1    Tilley, D.G.2
  • 30
    • 84938447945 scopus 로고
    • "'Direct search' solution of numerical and statistical problems"
    • Apr
    • R. Hooke and T. A. Jeeves, "'Direct search' solution of numerical and statistical problems," J. Assoc. Comput. Mach., vol. 8, no. 2, pp. 212-229, Apr. 1961.
    • (1961) J. Assoc. Comput. Mach. , vol.8 , Issue.2 , pp. 212-229
    • Hooke, R.1    Jeeves, T.A.2
  • 31
    • 0042156898 scopus 로고    scopus 로고
    • "Switching parameter maps - A new approach to the validity domain of power device models"
    • Toulouse, France, Sep
    • B. Allard, H. Garrab, W. Mi, K. Ammous, and H. Morel, "Switching parameter maps - A new approach to the validity domain of power device models," in Proc. EPE Conf., Toulouse, France, Sep. 2003, pp. 1220-1225.
    • (2003) Proc. EPE Conf. , pp. 1220-1225
    • Allard, B.1    Garrab, H.2    Mi, W.3    Ammous, K.4    Morel, H.5


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.