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Volumn 128, Issue 4, 2008, Pages

Fast inverter loss and temperature simulation and silicon carbide device evaluation for hybrid electric vehicle drives

Author keywords

Compact modeling; Driving cycle; Hybrid vehicle; Power semiconductor devices; Silicon carbide

Indexed keywords

COMPACT MODELING; DEVICE MODELS; DEVICE SELECTION; DRIVING CYCLE; HYBRID ELECTRIC VEHICLE; HYBRID VEHICLES; INTEGRATED FRAMEWORKS; INVERTER LOSS; MATLAB /SIMULINK; NEW MATERIAL; NOVEL METHODS; PERFORMANCE GAIN; PIN DIODE; POWER DEVICES; POWER SEMICONDUCTOR DEVICES; POWER-LOSSES; POWERTRAIN DESIGN; REAL TIME; SILICON CARBIDE DEVICES; SILICON CARBIDE SCHOTTKY DIODES; SIMULATION FRAMEWORK; TEMPERATURE SIMULATIONS;

EID: 58049117248     PISSN: 09136339     EISSN: 13488163     Source Type: Journal    
DOI: 10.1541/ieejias.128.441     Document Type: Article
Times cited : (12)

References (17)
  • 1
    • 80053482342 scopus 로고
    • A dynamic electro-thermal model for the IGBT
    • A. R. Hefner: "A dynamic electro-thermal model for the IGBT", IEEE Trans. Industry Applications. Vol. 30, No. 2, pp. 394-405 (1994-3)
    • (1993) IEEE Trans. Industry Applications , vol.30 , Issue.2 , pp. 394-405
    • Hefner, A.R.1
  • 2
  • 3
    • 12544254846 scopus 로고    scopus 로고
    • Electromagnetic transient simulation models for accurate representation of switching losses and thermal performance in power electronic systems
    • A. D. Rajapakse, A. M. Gole, and P. L. Wilson: "Electromagnetic transient simulation models for accurate representation of switching losses and thermal performance in power electronic systems", IEEE Trans. Power Delivery, Vol. 20, No. 1, pp. 319-327 (2005-1)
    • (2001) IEEE Trans. Power Delivery , vol.20 , Issue.1 , pp. 319-327
    • Rajapakse, A.D.1    Gole, A.M.2    Wilson, P.L.3
  • 4
    • 33847740589 scopus 로고    scopus 로고
    • Inverter dynamic electro-thermal modeling and simulation with experimental verification
    • J. Reichl, J.-S. Lai, A. Hefner, T. McNutt, and D. Beming: "Inverter dynamic electro-thermal modeling and simulation with experimental verification", In PESC Conf. Rec, Recife (2005-6)
    • (2005) PESC Conf. Rec, Recife
    • Reichl, J.1    Lai, J.-S.2    Hefner, A.3    McNutt, T.4    Beming, D.5
  • 5
    • 33947178937 scopus 로고    scopus 로고
    • Electrothermal simulation of multichip-module with novel transient thermal model and timedependent boundary conditions
    • Y. C. Gerstenmaier, A. Castellazzi, and G. K. M. Wachutka: "Electrothermal simulation of multichip-module with novel transient thermal model and timedependent boundary conditions", IEEE Trans. Power Electronics, Vol. 21, No. 1, pp. 45-55 (2006-1)
    • (2001) IEEE Trans. Power Electronics , vol.21 , Issue.1 , pp. 45-55
    • Gerstenmaier, Y.C.1    Castellazzi, A.2    Wachutka, G.K.M.3
  • 6
    • 34248203403 scopus 로고    scopus 로고
    • Exploration of power device reliability using compact thermal models and fast electro-thermal simulation
    • A. T. Bryant, P. A. Mawby, P. R. Palmer, E. Santi, and J. L. Hudgins: "Exploration of power device reliability using compact thermal models and fast electro-thermal simulation", In IAS Conf. Rec, Tampa (2006-10)
    • (2006) IAS Conf. Rec, Tampa
    • Bryant, A.T.1    Mawby, P.A.2    Palmer, P.R.3    Santi, E.4    Hudgins, J.L.5
  • 7
    • 34547915611 scopus 로고    scopus 로고
    • The use of condition maps in the design and testing of power electronic circuits and devices
    • 7
    • A. T. Bryant, N-A. Parker-Allotey, and P. R. Palmer: "The use of condition maps in the design and testing of power electronic circuits and devices", IEEE Trans. Industry Applications, Vol. 43, No. 4, pp. 874-883 (2007-7)
    • (2007) IEEE Trans. Industry Applications , vol.43 , Issue.4 , pp. 874-883
    • Bryant, A.T.1    Parker-Allotey, N.-A.2    Palmer, P.R.3
  • 8
    • 31144443023 scopus 로고    scopus 로고
    • A fast power loss calculation method for long real time thermal simulation of IGBT modules for a three-phase inverter system
    • Also in EPE Conf. Rec., Dresden 2005-9
    • Z. Zhou, M. S. Khanniche, P. Igic, S. T. Kong, M. Towers, and P. A. Mawby: "A fast power loss calculation method for long real time thermal simulation of IGBT modules for a three-phase inverter system", Int. J. Numerical Modelling: Electronic Networks, Devices and Fields, Vol. 19, pp. 33-46 (2006) Also in EPE Conf. Rec., Dresden (2005-9)
    • (2006) Int. J. Numerical Modelling: Electronic Networks, Devices and Fields , vol.19 , pp. 33-46
    • Zhou, Z.1    Khanniche, M.S.2    Igic, P.3    Kong, S.T.4    Towers, M.5    Mawby, P.A.6
  • 9
    • 0141787901 scopus 로고    scopus 로고
    • Circuit simulator models for the diode and IGBT with full temperature dependent features
    • P. R. Palmer, E. Santi, J. L. Hudgins, X. Kang, J. C. Joyce, and P. Y. Eng: "Circuit simulator models for the diode and IGBT with full temperature dependent features", IEEE Trans. Power Electronics, Vol. 18, No. 5, pp. 1220-1229 (2003-9)
    • (2003) IEEE Trans. Power Electronics , vol.18 , Issue.5 , pp. 1220-1229
    • Palmer, P.R.1    Santi, E.2    Hudgins, J.L.3    Kang, X.4    Joyce, J.C.5    Eng, P.Y.6
  • 10
    • 38349009183 scopus 로고    scopus 로고
    • Physical modeling of fast p-i-n diodes with carrier lifetime zoning, part I: Device model
    • A. T. Bryant, L. Lu, E. Santi, P. R. Palmer, and J. L. Hudgins: "Physical modeling of fast p-i-n diodes with carrier lifetime zoning, part I: device model", IEEE Trans. Power Electronics, Vol. 23, No. 1, pp. 189-197 (2008-1)
    • (2001) IEEE Trans. Power Electronics , vol.23 , Issue.1 , pp. 189-197
    • Bryant, A.T.1    Lu, L.2    Santi, E.3    Palmer, P.R.4    Hudgins, J.L.5
  • 12
    • 34547915611 scopus 로고    scopus 로고
    • Simulation and optimisation of diode and IGBT interaction in a chopper cell using MATLAB and Simulink
    • 7
    • A. T. Bryant, P. R. Palmer, E. Santi, and J. L. Hudgins: "Simulation and optimisation of diode and IGBT interaction in a chopper cell using MATLAB and Simulink", IEEE Trans. Industry Applications, Vol. 43, No. 4, pp. 902-910 (2007-7)
    • (2007) IEEE Trans. Industry Applications , vol.43 , Issue.4 , pp. 902-910
    • Bryant, A.T.1    Palmer, P.R.2    Santi, E.3    Hudgins, J.L.4
  • 14
    • 2942527523 scopus 로고    scopus 로고
    • Silicon carbide PIN and merged PIN schottky power diode models implemented in the Saber circuit simulator
    • T. R. McNutt, A. R. Hefner, H. A. Mantooth, J. Duliere, D. W. Beming, and R. Singh: "Silicon carbide PIN and merged PIN schottky power diode models implemented in the Saber circuit simulator", IEEE Trans. Power Electronics, Vol. 19, No. 3, pp. 573-581 (2004-5)
    • (2004) IEEE Trans. Power Electronics , vol.19 , Issue.3 , pp. 573-581
    • McNutt, T.R.1    Hefner, A.R.2    Mantooth, H.A.3    Duliere, J.4    Beming, D.W.5    Singh, R.6
  • 15
    • 24144462863 scopus 로고    scopus 로고
    • Extraction of accurate thermal compact models for fast electro-thermal simulation of IGBT modules in hybrid electric vehicles
    • M. Ciappa, W. Fichtner, T. Kojima, Y. Yamada, and Y. Nishibe: "Extraction of accurate thermal compact models for fast electro-thermal simulation of IGBT modules in hybrid electric vehicles", Microelectronics Reliability, Vol. 45, pp. 1694-1699 (2005)
    • (2005) Microelectronics Reliability , vol.45 , pp. 1694-1699
    • Ciappa, M.1    Fichtner, W.2    Kojima, T.3    Yamada, Y.4    Nishibe, Y.5
  • 17


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.