Analysis of strain error sources in micro-beam Laue diffraction

Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

Volumn 660, Issue 1, 2011, Pages 130-137

  Hofmann, Felix ^a   Eve, Sophie ^b   Belnoue, Jonathan ^c   Micha, Jean Sébastien ^d   Korsunsky, Alexander M ^a  

^a UNIVERSITY OF OXFORD   (United Kingdom)

^b LABORATOIRE CRISMAT   (France)

^c UNIVERSITY OF BRISTOL   (United Kingdom)

^d CEA GRENOBLE   (France)

Author keywords

Elastic strain measurement; Error analysis; Micro beam Laue diffraction; Single crystal

Indexed keywords

ACCURATE MEASUREMENT; ANALYSIS APPROACH; ANALYTICAL TECHNIQUES; BEAM BENDING; BEAM LINES; COMBINATION RULES; ELASTIC STRAIN; ELASTIC STRAIN MEASUREMENT; ENGINEERING ALLOYS; ERROR SOURCES; EUROPEAN SYNCHROTRON RADIATION FACILITIES; EXPERIMENTAL METHODS; EXPERIMENTAL SETUP; FOUR-POINT; GEOMETRICAL UNCERTAINTY; IN-SITU LOADING; LATTICE ORIENTATIONS; LAUE DIFFRACTION; LOCAL LATTICE; MATERIAL BULK; MEASUREMENT TECHNIQUES; MECHANICAL RESPONSE; MICRO BEAMS; NON-DESTRUCTIVE MEASUREMENT; SIMULATION-BASED; STRAIN ACCURACY; SURFACE CHARACTERISATION; THIN SECTION;

CRYSTAL ORIENTATION; DIFFRACTION; ERROR ANALYSIS; GERMANIUM; INSTRUMENT ERRORS; MEASUREMENT ERRORS; MECHANICAL STABILITY; NEMATIC LIQUID CRYSTALS; POLYCRYSTALLINE MATERIALS; SINGLE CRYSTALS; STRAIN MEASUREMENT; UNCERTAINTY ANALYSIS;

STRAIN;

EID: 80255123304     PISSN: 01689002     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.nima.2011.09.009     Document Type: Article

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