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Volumn 35, Issue 6, 2004, Pages 431-439

Differential-aperture X-ray structural microscopy: A submicron-resolution three-dimensional probe of local microstructure and strain

Author keywords

Deformation; Diffraction; Microstructure; Strain; X ray microscopy

Indexed keywords


EID: 2342472175     PISSN: 09684328     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.micron.2004.02.004     Document Type: Conference Paper
Times cited : (63)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.