Automated indexing for texture and strain measurement with broad-bandpass x-ray microbeams

Journal of Applied Physics

Volumn 86, Issue 9, 1999, Pages 5249-5255

  Chung, Jin Seok ^a   Ice, Gene E ^a  

^a OAK RIDGE NATIONAL LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000581383     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.371507     Document Type: Article

References (16)

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