X-ray microdiffraction and strain gradient crystal plasticity studies of geometrically necessary dislocations near a Ni bicrystal grain boundary

International Journal of Plasticity

Volumn 25, Issue 5, 2009, Pages 920-941

  Ohashi, Tetsuya ^a   Barabash, R I ^b   Pang, J W L ^b   Ice, G E ^b   Barabash, O M ^b  

^a KITAMI INSTITUTE OF TECHNOLOGY   (Japan)

^b OAK RIDGE NATIONAL LABORATORY   (United States)

Author keywords

Crystal plasticity; Dislocations; Grain boundaries; Polycrystalline material; Stress relaxation

Indexed keywords

BICRYSTALS; DIFFRACTION; GRAIN BOUNDARIES; GRAIN SIZE AND SHAPE; PLASTIC DEFORMATION; PLASTICITY; POLYCRYSTALLINE MATERIALS; RESIDUAL STRESSES; SCANNING ELECTRON MICROSCOPY; SINGLE CRYSTALS; STRESS RELAXATION; TENSILE TESTING; X RAY DIFFRACTION;

BICRYSTAL GRAIN BOUNDARIES; CRYSTAL PLASTICITY; CRYSTALLOGRAPHIC ORIENTATIONS; DISLOCATIONS; ELASTIC STRAINS; EXPERIMENTAL MEASUREMENTS; FINITE ELEMENT SIMULATIONS; GEOMETRICALLY NECESSARY DISLOCATIONS; GRAIN ORIENTATIONS; INHOMOGENEOUS PLASTIC DEFORMATIONS; MATERIALS PHYSICS; ORIENTATION IMAGING MICROSCOPIES; PLASTIC RESPONSE; POLYCHROMATIC X-RAY MICRODIFFRACTION; STRAIN GRADIENTS; STRUCTURAL INHOMOGENEITIES; TENSILE TESTS; UNIAXIAL TENSILE DEFORMATIONS; X RAY MICRO DIFFRACTIONS;

DISLOCATIONS (CRYSTALS);

EID: 61849117417     PISSN: 07496419     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ijplas.2008.04.009     Document Type: Article

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