Indexation and misorientation analysis of low-quality Laue diffraction patterns

Journal of Applied Crystallography

Volumn 42, Issue 1, 2009, Pages 116-124

  Gupta, Vipul K ^a   Agnew, Sean R ^a  

^a University of Virginia   (United States)

Author keywords

Fatigue; Geometrically necessary dislocations; Indexing; Micro Laue; Misorientation; Template matching

Indexed keywords

EID: 58249110493     PISSN: 00218898     EISSN: 16005767     Source Type: Journal    
DOI: 10.1107/S0021889808042349     Document Type: Article

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