Dislocation-based plasticity model and micro-beam Laue diffraction analysis of polycrystalline Ni foil: A forward prediction

Philosophical Magazine

Volumn 90, Issue 30, 2010, Pages 3999-4011

  Song, Xu ^a   Hofmann, Felix ^a   Korsunsky, Alexander M ^a  

^a UNIVERSITY OF OXFORD   (United Kingdom)

Author keywords

Laue spot streaking; local lattice misorientation; micro beam Laue; strain gradient crystal plasticity

Indexed keywords

2D DETECTOR; ANISOTROPIC BROADENING; BEAM LINES; DIAMOND LIGHT SOURCE; DIFFRACTION PEAKS; FINITE ELEMENT MODELS; FORWARD PREDICTION; GAUGE VOLUMES; GRAIN MORPHOLOGIES; GRAIN ORIENTATION; INTEGRATION POINTS; LAUE DIFFRACTION; LAUE DIFFRACTION PATTERNS; LAUE SPOTS; LENGTH SCALE; LOCAL LATTICE; LOCAL LATTICE MISORIENTATION; MICRO BEAMS; MICROSCOPIC LEVELS; PLASTIC STRAIN; PLASTICITY MODEL; POLYCRYSTALLINE; POST-PROCESSOR; SIMULATION PATTERNS; STRAIN GRADIENT CRYSTAL PLASTICITY; STRAIN GRADIENTS;

DISLOCATIONS (CRYSTALS); FINITE ELEMENT METHOD; HOLOGRAPHIC INTERFEROMETRY; LIGHT SOURCES; PLASTIC DEFORMATION; PLASTICITY; X RAY DIFFRACTION;

DIFFRACTION;

EID: 77956379025     PISSN: 14786435     EISSN: 14786443     Source Type: Journal    
DOI: 10.1080/14786435.2010.502149     Document Type: Article

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