메뉴 건너뛰기




Volumn 84, Issue 4, 2011, Pages

Microscopic modeling of the dielectric properties of silicon nitride

Author keywords

[No Author keywords available]

Indexed keywords


EID: 79961197724     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.84.045308     Document Type: Article
Times cited : (16)

References (77)
  • 1
    • 0033750188 scopus 로고    scopus 로고
    • JACTAW 0002-7820 10.1111/j.1151-2916.2000.tb01182.x
    • F. L. Riley, J. Am. Ceram. Soc. JACTAW 0002-7820 10.1111/j.1151-2916. 2000.tb01182.x 83, 245 (2000).
    • (2000) J. Am. Ceram. Soc. , vol.83 , pp. 245
    • Riley, F.L.1
  • 3
    • 0035281088 scopus 로고    scopus 로고
    • 2/plasma SiN stacks
    • DOI 10.1088/0268-1242/16/3/308, PII S0268124201171981
    • J. Schmidt, M. J. Kerr, and A. Cuevas, Semicond. Sci. Technol. SSTEET 0268-1242 10.1088/0268-1242/16/3/308 16, 164 (2001). (Pubitemid 32259318)
    • (2001) Semiconductor Science and Technology , vol.16 , Issue.3 , pp. 164-170
    • Schmidt, J.1    Kerr, M.2    Cuevas, A.3
  • 4
    • 0242273208 scopus 로고    scopus 로고
    • JECMA5 0361-5235 10.1007/s11664-003-0086-2
    • B. Sopori, J. Electron. Mater. JECMA5 0361-5235 10.1007/s11664-003-0086-2 32, 1034 (2003).
    • (2003) J. Electron. Mater. , vol.32 , pp. 1034
    • Sopori, B.1
  • 5
    • 26444477291 scopus 로고    scopus 로고
    • Atomic force microscopy local oxidation of silicon nitride thin films for mask fabrication
    • DOI 10.1088/0957-4484/16/11/045, PII S0957448405050245
    • I. Fernandez-Cuesta, X. Borrise, and F. Perez-Murano, Nanotechnology NNOTER 0957-4484 10.1088/0957-4484/16/11/045 16, 2731 (2005). (Pubitemid 41436800)
    • (2005) Nanotechnology , vol.16 , Issue.11 , pp. 2731-2737
    • Fernandez-Cuesta, I.1    Borrise, X.2    Perez-Murano, F.3
  • 9
    • 0032024519 scopus 로고    scopus 로고
    • IETDAI 0018-9383 10.1109/16.661229
    • T. P. Ma, IEEE Trans. Electron Devices IETDAI 0018-9383 10.1109/16.661229 45, 680 (1998).
    • (1998) IEEE Trans. Electron Devices , vol.45 , pp. 680
    • Ma, T.P.1
  • 10
  • 11
    • 79956033267 scopus 로고    scopus 로고
    • APPLAB 0003-6951 10.1063/1.1506941
    • Y. C. Yeo, T. J. King, and C. M. Hu, Appl. Phys. Lett. APPLAB 0003-6951 10.1063/1.1506941 81, 2091 (2002).
    • (2002) Appl. Phys. Lett. , vol.81 , pp. 2091
    • Yeo, Y.C.1    King, T.J.2    Hu, C.M.3
  • 12
    • 0004033098 scopus 로고
    • John Wiley and Sons, New York
    • R. W. G. Wyckoff, Crystal Structures, Vol. 2 (John Wiley and Sons, New York, 1963).
    • (1963) Crystal Structures , vol.2
    • Wyckoff, R.W.G.1
  • 13
    • 0042059097 scopus 로고
    • PLRBAQ 1098-0121 10.1103/PhysRevB.41.10727
    • A. Y. Liu and Marvin L. Cohen, Phys. Rev. B PLRBAQ 1098-0121 10.1103/PhysRevB.41.10727 41, 10727 (1990).
    • (1990) Phys. Rev. B , vol.41 , pp. 10727
    • Liu, A.Y.1    Marvin L. Cohen2
  • 15
    • 49249113908 scopus 로고    scopus 로고
    • PLRBAQ 1098-0121 10.1103/PhysRevB.78.064104
    • A. Kuwabara, K. Matsunaga, and I. Tanaka, Phys. Rev. B PLRBAQ 1098-0121 10.1103/PhysRevB.78.064104 78, 064104 (2008).
    • (2008) Phys. Rev. B , vol.78 , pp. 064104
    • Kuwabara, A.1    Matsunaga, K.2    Tanaka, I.3
  • 16
  • 17
    • 0542448235 scopus 로고    scopus 로고
    • PLRBAQ 1098-0121 10.1103/PhysRevB.54.R15594
    • L. Ouyang and W. Y. Ching, Phys. Rev. B PLRBAQ 1098-0121 10.1103/PhysRevB.54.R15594 54, R15594 (1996).
    • (1996) Phys. Rev. B , vol.54 , pp. 15594
    • Ouyang, L.1    Ching, W.Y.2
  • 19
  • 21
    • 18344411110 scopus 로고    scopus 로고
    • PLRBAQ 1098-0121 10.1103/PhysRevB.68.205203
    • F. Alvarez and A. A. Valladares, Phys. Rev. B PLRBAQ 1098-0121 10.1103/PhysRevB.68.205203 68, 205203 (2003).
    • (2003) Phys. Rev. B , vol.68 , pp. 205203
    • Alvarez, F.1    Valladares, A.A.2
  • 22
    • 17644442582 scopus 로고    scopus 로고
    • PLRBAQ 1098-0121 10.1103/PhysRevB.65.073202
    • J. F. Justo, F. de Brito Mota, and A. Fazzio, Phys. Rev. B PLRBAQ 1098-0121 10.1103/PhysRevB.65.073202 65, 073202 (2002).
    • (2002) Phys. Rev. B , vol.65 , pp. 073202
    • Justo, J.F.1    De Brito Mota, F.2    Fazzio, A.3
  • 23
    • 71449118565 scopus 로고    scopus 로고
    • PLRBAQ 1098-0121 10.1103/PhysRevB.80.144201
    • L. Giacomazzi and P. Umari, Phys. Rev. B PLRBAQ 1098-0121 10.1103/PhysRevB.80.144201 80, 144201 (2009).
    • (2009) Phys. Rev. B , vol.80 , pp. 144201
    • Giacomazzi, L.1    Umari, P.2
  • 24
    • 14744279217 scopus 로고    scopus 로고
    • 4(0 0 0 1) surface
    • DOI 10.1016/j.susc.2005.01.025, PII S0039602805000397
    • V. M. Bermudez, Surf. Sci. SUSCAS 0039-6028 10.1016/j.susc.2005.01.025 579, 11 (2005). (Pubitemid 40324864)
    • (2005) Surface Science , vol.579 , Issue.1 , pp. 11-20
    • Bermudez, V.M.1
  • 26
    • 14944341573 scopus 로고    scopus 로고
    • PLRBAQ 1098-0121 10.1103/PhysRevB.60.R2146
    • X. S. Wang, G. Zhai, J. Yang, and N. Cue, Phys. Rev. B PLRBAQ 1098-0121 10.1103/PhysRevB.60.R2146 60, R2146 (1999).
    • (1999) Phys. Rev. B , vol.60 , pp. 2146
    • Wang, X.S.1    Zhai, G.2    Yang, J.3    Cue, N.4
  • 27
    • 0001422020 scopus 로고    scopus 로고
    • PLRBAQ 1098-0121 10.1103/PhysRevB.58.1887
    • G. L. Zhao and M. E. Bachlechner, Phys. Rev. B PLRBAQ 1098-0121 10.1103/PhysRevB.58.1887 58, 1887 (1998).
    • (1998) Phys. Rev. B , vol.58 , pp. 1887
    • Zhao, G.L.1    Bachlechner, M.E.2
  • 29
    • 84966867038 scopus 로고
    • JESOAN 0013-4651 10.1149/1.2424093
    • S. M. Hu, J. Electrochem. Soc. JESOAN 0013-4651 10.1149/1.2424093 113, 693 (1966).
    • (1966) J. Electrochem. Soc. , vol.113 , pp. 693
    • Hu, S.M.1
  • 30
    • 0001176991 scopus 로고
    • JESOAN 0013-4651 10.1149/1.2408318
    • E. A. Taft, J. Electrochem. Soc. JESOAN 0013-4651 10.1149/1.2408318 118, 1341 (1971).
    • (1971) J. Electrochem. Soc. , vol.118 , pp. 1341
    • Taft, E.A.1
  • 35
    • 0001096933 scopus 로고    scopus 로고
    • PLRBAQ 1098-0121 10.1103/PhysRevB.55.10355
    • X. Gonze and C. Lee, Phys. Rev. B PLRBAQ 1098-0121 10.1103/PhysRevB.55. 10355 55, 10355 (1997).
    • (1997) Phys. Rev. B , vol.55 , pp. 10355
    • Gonze, X.1    Lee, C.2
  • 36
    • 3543103556 scopus 로고
    • PLRBAQ 1098-0121 10.1103/PhysRevB.47.1651
    • R. D. King-Smith and D. Vanderbilt, Phys. Rev. B PLRBAQ 1098-0121 10.1103/PhysRevB.47.1651 47, 1651 (1993).
    • (1993) Phys. Rev. B , vol.47 , pp. 1651
    • King-Smith, R.D.1    Vanderbilt, D.2
  • 37
    • 12044256522 scopus 로고
    • Macroscopic polarization in crystalline dielectrics: The geometric phase approach
    • DOI 10.1103/RevModPhys.66.899
    • R. Resta, Rev. Mod. Phys. RMPHAT 0034-6861 10.1103/RevModPhys.66.899 66, 899 (1994). (Pubitemid 24821630)
    • (1994) Reviews of Modern Physics , vol.66 , Issue.3 , pp. 899
    • Resta, R.1
  • 38
    • 0001462282 scopus 로고    scopus 로고
    • PRLTAO 0031-9007 10.1103/PhysRevLett.80.1800
    • R. Resta, Phys. Rev. Lett. PRLTAO 0031-9007 10.1103/PhysRevLett.80.1800 80, 1800 (1998).
    • (1998) Phys. Rev. Lett. , vol.80 , pp. 1800
    • Resta, R.1
  • 39
    • 0037037908 scopus 로고    scopus 로고
    • PRLTAO 0031-9007 10.1103/PhysRevLett.89.157602
    • P. Umari and A. Pasquarello, Phys. Rev. Lett. PRLTAO 0031-9007 10.1103/PhysRevLett.89.157602 89, 157602 (2002).
    • (2002) Phys. Rev. Lett. , vol.89 , pp. 157602
    • Umari, P.1    Pasquarello, A.2
  • 40
    • 0037048416 scopus 로고    scopus 로고
    • PRLTAO 0031-9007 10.1103/PhysRevLett.89.117602
    • I. Souza, J. Íñiguez, and D. Vanderbilt, Phys. Rev. Lett. PRLTAO 0031-9007 10.1103/PhysRevLett.89.117602 89, 117602 (2002).
    • (2002) Phys. Rev. Lett. , vol.89 , pp. 117602
    • Souza, I.1    Íñiguez, J.2    Vanderbilt, D.3
  • 41
    • 4243606192 scopus 로고
    • PRLTAO 0031-9007 10.1103/PhysRevLett.55.2471
    • R. Car and M. Parrinello, Phys. Rev. Lett. PRLTAO 0031-9007 10.1103/PhysRevLett.55.2471 55, 2471 (1985).
    • (1985) Phys. Rev. Lett. , vol.55 , pp. 2471
    • Car, R.1    Parrinello, M.2
  • 42
    • 4143141420 scopus 로고    scopus 로고
    • PLRBAQ 1098-0121 10.1103/PhysRevB.68.085114
    • P. Umari and A. Pasquarello, Phys. Rev. B PLRBAQ 1098-0121 10.1103/PhysRevB.68.085114 68, 085114 (2003).
    • (2003) Phys. Rev. B , vol.68 , pp. 085114
    • Umari, P.1    Pasquarello, A.2
  • 46
    • 33748470991 scopus 로고    scopus 로고
    • Dielectric discontinuity at structural boundaries in Si
    • DOI 10.1063/1.2335584
    • J. Nakamura and K. Natori, Appl. Phys. Lett. APPLAB 0003-6951 10.1063/1.2335584 89, 053118 (2006). (Pubitemid 44350282)
    • (2006) Applied Physics Letters , vol.89 , Issue.5 , pp. 053118
    • Nakamura, J.1    Natori, A.2
  • 48
  • 49
    • 34347350165 scopus 로고    scopus 로고
    • PLRBAQ 1098-0121 10.1103/PhysRevB.75.205121
    • M. Stengel and N. A. Spaldin, Phys. Rev. B PLRBAQ 1098-0121 10.1103/PhysRevB.75.205121 75, 205121 (2007).
    • (2007) Phys. Rev. B , vol.75 , pp. 205121
    • Stengel, M.1    Spaldin, N.A.2
  • 51
    • 34548043119 scopus 로고
    • PLRBAQ 1098-0121 10.1103/PhysRevB.34.7146
    • R. Resta and K. Kunc, Phys. Rev. B PLRBAQ 1098-0121 10.1103/PhysRevB.34. 7146 34, 7146 (1986).
    • (1986) Phys. Rev. B , vol.34 , pp. 7146
    • Resta, R.1    Kunc, K.2
  • 52
    • 0034894812 scopus 로고    scopus 로고
    • PLRBAQ 1098-0121 10.1103/PhysRevB.63.205426
    • B. Meyer and D. Vanderbilt, Phys. Rev. B PLRBAQ 1098-0121 10.1103/PhysRevB.63.205426 63, 205426 (2001).
    • (2001) Phys. Rev. B , vol.63 , pp. 205426
    • Meyer, B.1    Vanderbilt, D.2
  • 53
    • 0001048838 scopus 로고    scopus 로고
    • PLRBAQ 1098-0121 10.1103/PhysRevB.59.12301
    • L. Bengtsson, Phys. Rev. B PLRBAQ 1098-0121 10.1103/PhysRevB.59.12301 59, 12301 (1999).
    • (1999) Phys. Rev. B , vol.59 , pp. 12301
    • Bengtsson, L.1
  • 55
    • 79961199892 scopus 로고    scopus 로고
    • [http://www.quantum-espresso.org].
  • 56
    • 1842816907 scopus 로고
    • PLRBAQ 1098-0121 10.1103/PhysRevB.13.5188
    • H. J. Monkhorst and J. D. Pack, Phys. Rev. B PLRBAQ 1098-0121 10.1103/PhysRevB.13.5188 13, 5188 (1976).
    • (1976) Phys. Rev. B , vol.13 , pp. 5188
    • Monkhorst, H.J.1    Pack, J.D.2
  • 58
    • 0000829495 scopus 로고
    • PLRBAQ 1098-0121 10.1103/PhysRevB.33.2432
    • R. D. Carson and S. E. Schnatterly, Phys. Rev. B PLRBAQ 1098-0121 10.1103/PhysRevB.33.2432 33, 2432 (1986) and references therein.
    • (1986) Phys. Rev. B , vol.33 , pp. 2432
    • Carson, R.D.1    Schnatterly, S.E.2
  • 60
    • 79961193856 scopus 로고    scopus 로고
    • qbox, a scalable implementation of first-principles molecular dynamics
    • F. Gygi, qbox, a scalable implementation of first-principles molecular dynamics [http://eslab.ucdavis.edu].
    • Gygi, F.1
  • 63
    • 79961174282 scopus 로고    scopus 로고
    • See [http://www.ncnr.nist.gov/resources/n-lengths/].
  • 64
  • 65
    • 0017453742 scopus 로고
    • PSSABA 0031-8965 10.1002/pssa.2210390205
    • J. Bauer, Phys. Status Solidi A PSSABA 0031-8965 10.1002/pssa.2210390205 39, 411 (1977).
    • (1977) Phys. Status Solidi A , vol.39 , pp. 411
    • Bauer, J.1
  • 66
    • 34250290176 scopus 로고
    • JMTSAS 0022-2461 10.1007/BF00552249
    • J. S. Thorp and R. I. Sharif, J. Mater. Sci. JMTSAS 0022-2461 10.1007/BF00552249 12, 2274 (1977).
    • (1977) J. Mater. Sci. , vol.12 , pp. 2274
    • Thorp, J.S.1    Sharif, R.I.2
  • 68
    • 0024621650 scopus 로고
    • JMTSAS 0022-2461 10.1007/BF01148763
    • T. Goto and T. Hirai, J. Mater. Sci. JMTSAS 0022-2461 10.1007/BF01148763 24, 821 (1989) and references therein.
    • (1989) J. Mater. Sci. , vol.24 , pp. 821
    • Goto, T.1    Hirai, T.2
  • 69
    • 0020475306 scopus 로고
    • 4 thin films
    • DOI 10.1016/0040-6090(82)90485-0
    • G. Rieder and F. Olcaytug, Thin Solid Films THSFAP 0040-6090 10.1016/0040-6090(82)90485-0 89, 95 (1982). (Pubitemid 12569532)
    • (1982) Thin Solid Films , vol.89 , Issue.1 , pp. 95-99
    • Rieder, G.1    Olcaytug, F.2
  • 70
    • 0018916109 scopus 로고
    • Preparation, characterization and applications of silicon nitride thin films
    • DOI 10.1016/0040-6090(80)90254-0
    • C. E. Morosanu, Thin Solid Films THSFAP 0040-6090 10.1016/0040-6090(80) 90254-0 65, 171 (1980). (Pubitemid 10465365)
    • (1980) Thin Solid Films , vol.65 , Issue.2 , pp. 171-208
    • Morosanu, C.E.1
  • 72
    • 43449094998 scopus 로고    scopus 로고
    • PLRBAQ 1098-0121 10.1103/PhysRevB.77.195406
    • E. K. Yu, D. A. Stewart, and S. Tiwari, Phys. Rev. B PLRBAQ 1098-0121 10.1103/PhysRevB.77.195406 77, 195406 (2008).
    • (2008) Phys. Rev. B , vol.77 , pp. 195406
    • Yu, E.K.1    Stewart, D.A.2    Tiwari, S.3
  • 73
    • 2942694255 scopus 로고    scopus 로고
    • JCPSA6 0021-9606 10.1063/1.1729853
    • J. Tobik and A. D. Corso, J. Chem. Phys. JCPSA6 0021-9606 10.1063/1.1729853 120, 9934 (2004).
    • (2004) J. Chem. Phys. , vol.120 , pp. 9934
    • Tobik, J.1    Corso, A.D.2
  • 74
    • 34247470730 scopus 로고    scopus 로고
    • PLRBAQ 1098-0121 10.1103/PhysRevB.75.155429
    • N. Shi and R. Ramprasad, Phys. Rev. B PLRBAQ 1098-0121 10.1103/PhysRevB.75.155429 75, 155429 (2007).
    • (2007) Phys. Rev. B , vol.75 , pp. 155429
    • Shi, N.1    Ramprasad, R.2
  • 75
    • 33749159500 scopus 로고    scopus 로고
    • First-principles study of dielectric properties of bulk NaCl and ultrathin NaCl films under a finite external electric field
    • DOI 10.1103/PhysRevB.72.085105, 085105
    • T. Ono and K. Hirose, Phys. Rev. B PLRBAQ 1098-0121 10.1103/PhysRevB.72. 085105 72, 085105 (2005). (Pubitemid 41506477)
    • (2005) Physical Review B - Condensed Matter and Materials Physics , vol.72 , Issue.8 , pp. 1-5
    • Ono, T.1    Hirose, K.2
  • 76
    • 41549164362 scopus 로고    scopus 로고
    • PLRBAQ 1098-0121 10.1103/PhysRevB.77.115355
    • H. G. Yoo and P. M. Fauchet, Phys. Rev. B PLRBAQ 1098-0121 10.1103/PhysRevB.77.115355 77, 115355 (2008).
    • (2008) Phys. Rev. B , vol.77 , pp. 115355
    • Yoo, H.G.1    Fauchet, P.M.2
  • 77
    • 44349150979 scopus 로고    scopus 로고
    • PLRBAQ 1098-0121 10.1103/PhysRevB.77.209903
    • H. G. Yoo and P. M. Fauchet, Phys. Rev. B PLRBAQ 1098-0121 10.1103/PhysRevB.77.209903 77, 209903 (E) (2008).
    • (2008) Phys. Rev. B , vol.77 , pp. 209903
    • Yoo, H.G.1    Fauchet, P.M.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.