Dielectric constant reduction in silicon nanostructures

Physical Review B - Condensed Matter and Materials Physics

Volumn 77, Issue 11, 2008, Pages

  Yoo, Han G ^a   Fauchet, Philippe M ^b  

^a UNIVERSITY OF ROCHESTER   (United States)

^b University of Rochester   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 41549164362     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.77.115355     Document Type: Article

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