Dielectric discontinuity at structural boundaries in Si

Applied Physics Letters

Volumn 89, Issue 5, 2006, Pages

  Nakamura, Jun ^a   Natori, Akiko ^a  

^a UNIVERSITY OF ELECTRO COMMUNICATIONS   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC FIELDS; OPTOELECTRONIC DEVICES; PERMITTIVITY; SILICON; STACKING FAULTS;

ATOMIC ARRANGEMENT; FIRST PRINCIPLES CALCULATIONS; HETEROBOUNDARY; TWIN BOUNDARY;

SEMICONDUCTOR METAL BOUNDARIES;

EID: 33748470991     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2335584     Document Type: Article

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