메뉴 건너뛰기




Volumn 54, Issue 9, 2011, Pages 1784-1796

Efficient multi-level fault simulation of HW/SW systems for structural faults

Author keywords

fault simulation; multi level; transaction level modeling

Indexed keywords


EID: 79961082195     PISSN: 1674733X     EISSN: None     Source Type: Journal    
DOI: 10.1007/s11432-011-4366-9     Document Type: Article
Times cited : (8)

References (35)
  • 1
    • 33645827136 scopus 로고    scopus 로고
    • Test consideration for nanometer-scale CMOS circuits
    • Roy K, Mak T, Cheng K. Test consideration for nanometer-scale CMOS circuits. IEEE Des Test Comput, 2006, 23: 128-136.
    • (2006) IEEE Des Test Comput , vol.23 , pp. 128-136
    • Roy, K.1    Mak, T.2    Cheng, K.3
  • 2
    • 33846118079 scopus 로고    scopus 로고
    • Designing reliable systems from unreliable components: the challenges of transistor variability and degradation
    • Borkar S. Designing reliable systems from unreliable components: the challenges of transistor variability and degradation. IEEE Micro, 2005, 25: 10-16.
    • (2005) IEEE Micro , vol.25 , pp. 10-16
    • Borkar, S.1
  • 3
    • 4544265514 scopus 로고    scopus 로고
    • Reliability optimization models for embedded systems with multiple applications
    • Wattanapongsakorn N, Levitan S P. Reliability optimization models for embedded systems with multiple applications. IEEE Trans Reliab, 2004, 53: 406-416.
    • (2004) IEEE Trans Reliab , vol.53 , pp. 406-416
    • Wattanapongsakorn, N.1    Levitan, S.P.2
  • 6
    • 0141630235 scopus 로고    scopus 로고
    • Multi-level fault injections in VHDL descriptions: Alternative approaches and experiments
    • Leveugle R, Hadjiat K. Multi-level fault injections in VHDL descriptions: Alternative approaches and experiments. J Electron Test, 2003, 19: 559-575.
    • (2003) J Electron Test , vol.19 , pp. 559-575
    • Leveugle, R.1    Hadjiat, K.2
  • 8
    • 13244289780 scopus 로고    scopus 로고
    • High level fault injection for attack simulation in smart cards
    • Kenting, Taiwan, China
    • Rothbart K, Neffe U, Steger C, et al. High level fault injection for attack simulation in smart cards. In: Proceedings of the 13th Asian Test Symposium, Kenting, Taiwan, China, 2004. 118-121.
    • (2004) Proceedings of the 13th Asian Test Symposium , pp. 118-121
    • Rothbart, K.1    Neffe, U.2    Steger, C.3
  • 9
    • 0029393062 scopus 로고
    • Active timing multilevel fault-simulation with switch-level accuracy
    • Meyer W, Camposano R. Active timing multilevel fault-simulation with switch-level accuracy. IEEE Trans CAD Integr Circ Syst, 1995, 14: 1241-1256.
    • (1995) IEEE Trans CAD Integr Circ Syst , vol.14 , pp. 1241-1256
    • Meyer, W.1    Camposano, R.2
  • 11
    • 17044362241 scopus 로고    scopus 로고
    • Using RT level component descriptions for single stuck-at hierarchical fault simulation
    • Navabi Z, Mirkhani S, Lavasani M, et al. Using RT level component descriptions for single stuck-at hierarchical fault simulation. J Electron Test, 2004, 20: 575-589.
    • (2004) J Electron Test , vol.20 , pp. 575-589
    • Navabi, Z.1    Mirkhani, S.2    Lavasani, M.3
  • 13
    • 0033733157 scopus 로고    scopus 로고
    • Handling behavioral components in multi-level concurrent fault simulation
    • Washington DC, USA
    • Lentz K P, Homer J B. Handling behavioral components in multi-level concurrent fault simulation. In: Proceedings of the 33th Annual Simulation Symposium, Washington DC, USA, 2000. 149-156.
    • (2000) Proceedings of the 33th Annual Simulation Symposium , pp. 149-156
    • Lentz, K.P.1    Homer, J.B.2
  • 14
    • 0029506357 scopus 로고
    • A new architectural-level fault simulation using propagation prediction of grouped fault-effects
    • Austin, TX, USA
    • Hsiao M S, Patel J H. A new architectural-level fault simulation using propagation prediction of grouped fault-effects. In: Proceedings of International Conference on Computer Design, Austin, TX, USA, 1995. 628.
    • (1995) Proceedings of International Conference on Computer Design , pp. 628
    • Hsiao, M.S.1    Patel, J.H.2
  • 21
    • 49749130408 scopus 로고    scopus 로고
    • Cycle-approximate retargetable performance estimation at the transaction level
    • Munich, Germany
    • Hwang Y, Abdi S, Gajski D. Cycle-approximate retargetable performance estimation at the transaction level. In: Proceedings of Design, Automation and Test in Europe, Munich, Germany, 2008. 3-8.
    • (2008) Proceedings of Design, Automation and Test in Europe , pp. 3-8
    • Hwang, Y.1    Abdi, S.2    Gajski, D.3
  • 22
    • 46749134405 scopus 로고    scopus 로고
    • Introducing energy and area estimation in HW/SW design flow based on transaction level modeling
    • Dhahran, Saudi Arabia
    • Cheema M, Hammami O. Introducing energy and area estimation in HW/SW design flow based on transaction level modeling. In: Proceedings of International Conference on Microelectronics, Dhahran, Saudi Arabia, 2006. 182-185.
    • (2006) Proceedings of International Conference on Microelectronics , pp. 182-185
    • Cheema, M.1    Hammami, O.2
  • 23
    • 77953091566 scopus 로고    scopus 로고
    • Open SystemC Initiative (OSCI) TLM Working Group, June
    • Open SystemC Initiative (OSCI) TLM Working Group. Transaction level modeling standard 2 (OSCI TLM 2), June 2008. www. systemc. org.
    • (2008) Transaction level modeling standard 2 (OSCI TLM 2)
  • 26
    • 3042671688 scopus 로고    scopus 로고
    • EPIC: Profiling the propagation and effect of data errors in software
    • Hiller M, Jhumka A, Suri N. EPIC: Profiling the propagation and effect of data errors in software. IEEE Trans Comput, 2004, 53: 512-530.
    • (2004) IEEE Trans Comput , vol.53 , pp. 512-530
    • Hiller, M.1    Jhumka, A.2    Suri, N.3
  • 30
    • 0026970583 scopus 로고
    • Hope: An efficient parallel fault simulator for synchronous sequential circuits
    • Anaheim, CA, USA
    • Lee H K, Ha D S. Hope: An efficient parallel fault simulator for synchronous sequential circuits. In: Proceedings of ACM/IEEE Design Automation Conference, Anaheim, CA, USA, 1992. 336-340.
    • (1992) Proceedings of ACM/IEEE Design Automation Conference , pp. 336-340
    • Lee, H.K.1    Ha, D.S.2
  • 33
    • 73249140811 scopus 로고    scopus 로고
    • A novel simulation fault injection method for dependability analysis
    • Lee D, Na J. A novel simulation fault injection method for dependability analysis. IEEE Des Test Comput, 2009, 26: 50-61.
    • (2009) IEEE Des Test Comput , vol.26 , pp. 50-61
    • Lee, D.1    Na, J.2
  • 34
    • 77956211501 scopus 로고    scopus 로고
    • Generalized fault modeling for logic diagnosis
    • New York: Springer
    • Wunderlich H, Holst S. Generalized fault modeling for logic diagnosis. In: Models in Hardware Testing. New York: Springer, 2009. 133-155.
    • (2009) Models in Hardware Testing , pp. 133-155
    • Wunderlich, H.1    Holst, S.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.