메뉴 건너뛰기




Volumn , Issue , 1999, Pages 549-553

Defect-oriented mixed-level fault simulation of digital systems-on-a-chip using HDL

Author keywords

[No Author keywords available]

Indexed keywords

DESIGN HIERARCHY; FAULT SIMULATION; HIGH QUALITY; OPEN DEFECTS; SYSTEM MODULES; SYSTEMS-ON-A-CHIP; VERILOG;

EID: 84893629710     PISSN: 15301591     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/DATE.1999.761181     Document Type: Conference Paper
Times cited : (21)

References (25)
  • 1
    • 0002715761 scopus 로고
    • Test generation and fault simulation of behavioral models
    • Joel M. Schoen (Ed.), Prentice-Hall
    • J.R. Armstrong, F. Lam, P.C. Ward, "Test Generation and Fault Simulation of Behavioral Models", Joel M. Schoen (Ed.), Performance and Fault Modeling with VHDL, pp.240-303, Prentice-Hall, 1992.
    • (1992) Performance and Fault Modeling with VHDL , pp. 240-303
    • Armstrong, J.R.1    Lam, F.2    Ward, P.C.3
  • 3
    • 0029746899 scopus 로고    scopus 로고
    • A fault model for vhdl descriptions at the register transfer level
    • September
    • T. Riesgo, J. Uceda, "A Fault Model for VHDL Descriptions at the Register Transfer Level", Euro DAC with EUROVHDL 96, pp.462-467, September 1996.
    • (1996) Euro DAC with EUROVHDL 96 , pp. 462-467
    • Riesgo, T.1    Uceda, J.2
  • 4
  • 6
    • 0027271157 scopus 로고
    • Fast hierarchical multi-level fault simulation of sequential circuits with switch-level accuracy
    • Wolfgang Meyer, Raul Camposano, "Fast Hierarchical Multi-Level Fault Simulation of Sequential Circuits with Switch-Level Accuracy", Design Automation Conf. (DAC), pp.515-519, 1993.
    • (1993) Design Automation Conf. (DAC) , pp. 515-519
    • Meyer, W.1    Camposano, R.2
  • 9
    • 0030388487 scopus 로고    scopus 로고
    • Improving gate level fault coverage by rtl fault grading
    • Weiwei Mao, Ravi K. Gulati, "Improving Gate Level Fault Coverage by RTL Fault Grading", Proc. Int. Test Conf. (ITC), pp.150-159, 1996.
    • (1996) Proc. Int. Test Conf. (ITC) , pp. 150-159
    • Mao, W.1    Gulati, R.K.2
  • 10
    • 0029506357 scopus 로고
    • A new architecture-level fault simulation using propagation prediction of grouped faulteffects
    • M.S. Hsiao and J.H. Patel, "A new architecture-level fault simulation using propagation prediction of grouped faulteffects", Proc. Int. Conf. On Computer Design (ICCD), pp. 628-635, 1995.
    • (1995) Proc. Int. Conf. on Computer Design (ICCD) , pp. 628-635
    • Hsiao, M.S.1    Patel, J.H.2
  • 12
    • 0027883887 scopus 로고
    • Biased voting: A method for simulating cmos bridging faults in the presence of variable gate logic thresholds
    • P.C. Maxwell and R.C. Aitken, "Biased Voting: A Method for Simulating CMOS Bridging Faults in the Presence of Variable Gate Logic Thresholds", Proc. Int. Test Conf. (ITC), pp. 63-72, 1993.
    • (1993) Proc. Int. Test Conf. (ITC) , pp. 63-72
    • Maxwell, P.C.1    Aitken, R.C.2
  • 13
    • 0032319386 scopus 로고    scopus 로고
    • Sampling techniques of non-equally probable faults in vlsi systems
    • F.M. Gonçalves, J.P. Teixeira, "Sampling Techniques of Non-Equally Probable Faults in VLSI Systems", Proc. IEEE VLSI Test Symp. (VTS), pp. 283-288 , 1998.
    • (1998) Proc. IEEE VLSI Test Symp. (VTS) , pp. 283-288
    • Gonçalves, F.M.1    Teixeira, J.P.2
  • 16
    • 0027189119 scopus 로고
    • Bridge fault simulation strategies for cmos integrated circuits
    • B. Chess and T. Larrabee, "Bridge Fault Simulation Strategies for CMOS Integrated Circuits", Proc. Design Autom. Conf. (DAC), pp. 458-462, 1993.
    • (1993) Proc. Design Autom. Conf. (DAC) , pp. 458-462
    • Chess, B.1    Larrabee, T.2
  • 17
    • 0027865997 scopus 로고
    • Simulation of non-classical faults on the gate level-the fault simulator comsim
    • U. Mahlstedt, J. Alt, "Simulation of non-classical Faults on the Gate Level-The Fault Simulator COMSIM", Proc Int. Test Conf. (ITC), pp. 883-892, 1993.
    • (1993) Proc Int. Test Conf. (ITC) , pp. 883-892
    • Mahlstedt, U.1    Alt, J.2
  • 19
  • 24
    • 0002609165 scopus 로고
    • A neutral netlist of 10 combinational benchmark circuits and a target translator in fortran
    • F. Brglez, H. Fujiwara, "A Neutral Netlist of 10 Combinational Benchmark Circuits and a Target Translator in Fortran", Proc. Int. Symp. on Circuits and Systems (ISCAS), pp. 662-698, 1985.
    • (1985) Proc. Int. Symp. on Circuits and Systems (ISCAS) , pp. 662-698
    • Brglez, F.1    Fujiwara, H.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.